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The effect of Bi doping on the thermal conductivity of ZnO and ZnO:Al thin films

Correia, Filipe C.; Ribeiro, Joana M.; Ferreira, Armando; Reparaz, J. Sebastián; Goñi, Alejandro R.; Boll, Torben ORCID iD icon 1,2; Mendes, Adélio; Tavares, Carlos J.
1 Institut für Angewandte Materialien – Werkstoffkunde (IAM-WK), Karlsruher Institut für Technologie (KIT)
2 Institut für Nanotechnologie (INT), Karlsruher Institut für Technologie (KIT)

Abstract:

The dissipation of heat generation has been one of the largest obstacles in the design of semiconductor devices and reducing the thermal conductivity is vital for improving thermoelectric efficiency. This work focuses on the Bi doping effect on ZnO, and ZnO:Al thin films produced by magnetron sputtering with thickness varying between 500 and 900 nm. The approach introduces Bi ions, a higher mass element, into the ZnO metal-oxide matrix, to hinder phonon-mediated heat conduction and, consequently, reduce thermal conductivity. Atom probe tomography (APT) was employed to survey Bi doping distribution in ZnO:Al:Bi and ZnO:Bi thin films and to study the morphology of the grain boundaries. The thermal properties of the thin films were measured by frequency-domain thermoreflectance. Based on thermal conductivity results, it is concluded that the doping of ZnO films with Al has a significant effect on thermal conductivity, being reduced from 6.0 W m$^{−1}$ K${^−1}$ in its undoped state to 3.3 W m$^{−1}$ K$^{−1}$ for ZnO with ∼3 at.% of Al, mainly due to alloy scattering of phonons in the wurtzite cell. Further doping with Bi contributes to a slight reduction in the thermal conductivity of ZnO:Al.Bi films (2.9 W m$^{−1}$ K$^{−1}$), due to grain boundary scattering by Bi/Bi$_2$O$_3$ phases. ... mehr


Verlagsausgabe §
DOI: 10.5445/IR/1000152058
Veröffentlicht am 27.10.2022
Originalveröffentlichung
DOI: 10.1016/j.vacuum.2022.111572
Scopus
Zitationen: 7
Web of Science
Zitationen: 7
Dimensions
Zitationen: 7
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Nanotechnologie (INT)
Institut für Angewandte Materialien – Werkstoffkunde (IAM-WK)
Publikationstyp Zeitschriftenaufsatz
Publikationsmonat/-jahr 01.2023
Sprache Englisch
Identifikator ISSN: 0042-207X, 1879-2715
KITopen-ID: 1000152058
HGF-Programm 43.35.03 (POF IV, LK 01) Structural and Functional Behavior of Solid State Systems
Erschienen in Vacuum
Verlag Elsevier
Band 207
Seiten Art.-Nr.: 111572
Vorab online veröffentlicht am 09.10.2022
Schlagwörter Doped zinc oxide films, Thermal conductivity, Frequency domain thermoreflectance, Atom probe tomography, KNMFi 2018-021-024510 APT FIB
Nachgewiesen in Dimensions
Web of Science
Scopus
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