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Characterization of Boron-doped diamond and r-plane sapphire for plasma diagnostics in future nuclear fusion reactors -A survey of electrical and dielectric properties

Scherer, Theo 1; Strauss, Dirk 1; Aiello, Gaetano ORCID iD icon 1; Mazzocchi, Francesco ORCID iD icon 1; Meier, Andreas 1
1 Institut für Angewandte Materialien – Angewandte Werkstoffphysik (IAM-AWP), Karlsruher Institut für Technologie (KIT)

Abstract:

p-Boron-doped polycrystalline CVD diamond samples were produced
and delivered by the German company Diamond Materials in Freiburg
(Germany). In a first step, main properties of this candidates for diagnostic
and/or heating windows in future nuclear fusion reactors were
investigated. By a special measurement technique, it was possible to
determine the Boron doping concentration in Diamond by measurement
of the resistive properties by using the van der Pauw method. So
prepared, an irradiation campaign with neutrons and/or heavy ions
on these samples will follow. The second material investigated, was
r-plane single crystalline sapphire. For the first characterization the
dielectric properties of a 3*-wafer in dependency of the frequency in
a FABRY-PEROT resonator setup was performed. Also, this is the
preparation for the next irradiation experiments in this project.


Volltext §
DOI: 10.5445/IR/1000153307
Veröffentlicht am 01.12.2022
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Angewandte Materialien – Angewandte Werkstoffphysik (IAM-AWP)
Publikationstyp Vortrag
Publikationsdatum 07.09.2022
Sprache Englisch
Identifikator KITopen-ID: 1000153307
HGF-Programm 31.13.06 (POF IV, LK 01) Plant Engineering
Veranstaltung Verhandlungen der deutschen Physikalischen Gesellschaft (DPG): Fachverband Vakuumphysik und Vakuumtechnik (2022), Regensburg, Deutschland, 04.09.2022 – 09.09.2022
Bemerkung zur Veröffentlichung KFM 18: Focus Session: Diamond and related dielectric materials

KFM 18.5: Vortrag
Externe Relationen Abstract/Volltext
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