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Simulation framework for microwave SQUID multiplexer optimization

Schuster, C. 1; Wegner, M. ORCID iD icon 1,2; Kempf, S. 1,2
1 Institut für Mikro- und Nanoelektronische Systeme (IMS), Karlsruher Institut für Technologie (KIT)
2 Institut für Prozessdatenverarbeitung und Elektronik (IPE), Karlsruher Institut für Technologie (KIT)


So far, performance prediction and optimization of microwave SQUID multiplexers have largely been based on simple approximate analytical models and experimental results. This is caused by the complexity of the underlying physics and the intricacy of operation and readout parameters. As a simplified description can never account for all potential effects occurring in a real device, we have developed a software framework to simulate the characteristics and performance of a microwave SQUID multiplexer. Our simulation framework is a powerful tool to guide understanding and optimization of microwave SQUID multiplexers and other related devices. It includes common readout schemes such as open-loop or flux ramp-modulated readout as well as the nonlinear behavior of Josephson tunnel junctions. Moreover, it accounts for the non-zero response time of superconducting microwave resonators with high loaded quality factors as well as the most significant noise contributions such as amplifier noise, resonator noise, as well as SQUID noise. This ultimately leads to a prediction of device performance that is significantly better compared to simple analytical methods. ... mehr

Verlagsausgabe §
DOI: 10.5445/IR/1000155957
Veröffentlicht am 29.01.2024
DOI: 10.1063/5.0135124
Zitationen: 3
Web of Science
Zitationen: 3
Zitationen: 6
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Mikro- und Nanoelektronische Systeme (IMS)
Institut für Prozessdatenverarbeitung und Elektronik (IPE)
Publikationstyp Zeitschriftenaufsatz
Publikationsdatum 28.01.2023
Sprache Englisch
Identifikator ISSN: 0021-8979, 1089-7550, 1520-8850
KITopen-ID: 1000155957
HGF-Programm 54.12.01 (POF IV, LK 01) Detection and Measurement
Erschienen in Journal of Applied Physics
Verlag American Institute of Physics (AIP)
Band 133
Heft 4
Seiten Art.Nr. 044503
Nachgewiesen in Dimensions
Web of Science
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