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Beam test studies with silicon sensor module prototypes for the CMS Phase-2 Outer Tracker

Wittig, F. 1; Koppenhöfer, R. ORCID iD icon 1; Maier, S. 1; Nürnberg, A.
1 Institut für Experimentelle Teilchenphysik (ETP), Karlsruher Institut für Technologie (KIT)

Abstract:

The Large Hadron Collider (LHC) at CERN will be upgraded to the High-Luminosity LHC (HL-LHC) by 2029. In order to fully exploit the physics potential of the high luminosity era the experiments must undergo major upgrades. In the context of the upgrade of the Compact Muon Solenoid (CMS) experiment the silicon tracker will be fully replaced. The outer part of the new tracker (Outer Tracker) will be equipped with about 13,000 double-layer silicon sensor modules with two different flavors: PS modules consisting of a macro-pixel and a strip sensor and 2S modules using two strip sensors. These modules can discriminate between trajectories of charged particles with low and high transverse momentum. The different curvature of the trajectories in the CMS magnetic field leads to different hit signatures in the two sensor layers. By reading out both sensors, matching hits in the seed and correlation layer "stubs" are identified. This stub information is generated at the LHC bunch crossing frequency of 40 MHz and serves as input for the first stage of the CMS trigger. In order to quantify the hit and stub detection efficiency, beam tests have been performed. ... mehr


Verlagsausgabe §
DOI: 10.5445/IR/1000156499
Veröffentlicht am 06.03.2023
Originalveröffentlichung
DOI: 10.1088/1748-0221/18/01/C01005
Scopus
Zitationen: 1
Dimensions
Zitationen: 1
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Experimentelle Teilchenphysik (ETP)
Publikationstyp Zeitschriftenaufsatz
Publikationsdatum 10.01.2023
Sprache Englisch
Identifikator ISSN: 1748-0221
KITopen-ID: 1000156499
Erschienen in Journal of Instrumentation
Verlag Institute of Physics Publishing Ltd (IOP Publishing Ltd)
Band 18
Seiten Art.-Nr.: C01005
Schlagwörter Particle tracking detectors, Radiation damage to detector materials (solid state), Radiation-hard detectors, Si microstrip and pad detectors
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Scopus
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