Zugehörige Institution(en) am KIT | Institut für Technische Physik (ITEP) Karlsruhe Nano Micro Facility (KNMF) Institut für Angewandte Materialien – Werkstoffkunde (IAM-WK) |
Publikationstyp | Forschungsdaten |
Publikationsdatum | 14.04.2023 |
Erstellungsdatum | 11.01.2021 - 11.04.2023 |
Identifikator | DOI: 10.5445/IR/1000157792 KITopen-ID: 1000157792 |
Lizenz | Creative Commons Namensnennung – Weitergabe unter gleichen Bedingungen 4.0 International |
Vorab online veröffentlicht am | 11.04.2023 |
Schlagwörter | Scanning Electron Microscopy, Electron Backscatter Diffraction, Compression Testing, Yield Strength, Creep Testing, Creep Rate, Volume Fraction |
Liesmich | Scanning electron microscopy images are provided as tif files named according to the figure number in the manuscript. Short notations highlighting the sample condition are added. Additional micrographs not presented in the manuscript are highlighted by "-add". All micrographs are taken with backscattered electron contrast. Orientation imaging microscopy data by electron backscatter diffraction is provided in the form of jpg files of inverse pole figure color coded maps (for both phases BCC and C14). The legends of the inverse pole figure maps are added as well. The images are 40 x 40 µm² with 0.1 µm step size. Additionally, image quality maps were added. Number data is provided as ASCII files with tabulator separation. Files including multiple sample conditions contain columns with “condition” designation. |
Art der Forschungsdaten | Dataset |
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