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Fano Interference in Microwave Resonator Measurements

Günzler, Simon ORCID iD icon; Dennis, Rieger; Martin, Spiecker; Ameya, Nambisan; Wolfgang, Wernsdorfer 1; Ioan, Pop
1 Physikalisches Institut (PHI), Karlsruher Institut für Technologie (KIT)

Abstract (englisch):

Resonator measurements are a simple but powerful tool to characterize a material’s microwave response. The losses of a resonant mode are quantified by its internal quality factor Qi, which can be extracted from the scattering coefficient in a microwave reflection or transmission measurement. Here we show that a systematic error on Qi arises from Fano interference of the signal with a background path. Limited knowledge of the interfering paths in a given setup translates into a range of uncertainty for Qi, which increases with the coupling coefficient. We experimentally illustrate the relevance of Fano interference in typical microwave resonator measurements and the associated pitfalls encountered in extracting Qi. On the other hand, we also show how to characterize and utilize the Fano interference to eliminate the systematic error.


Zugehörige Institution(en) am KIT Institut für QuantenMaterialien und Technologien (IQMT)
Physikalisches Institut (PHI)
Publikationstyp Vortrag
Publikationsdatum 08.03.2023
Sprache Englisch
Identifikator KITopen-ID: 1000158857
HGF-Programm 47.12.01 (POF IV, LK 01) Advanced Solid-State Qubits and Qubit Systems
Veranstaltung American Physical Society's March Meeting (APS 2023), Las Vegas, NV, USA, 05.03.2023 – 10.03.2023
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