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Chemical phases in the solution-grown Zn(O,S) buffer of post-annealed Cu(In,Ga)Se$_{2}$ solar cells investigated by transmission electron microscopy and electroreflectance

Jin, Xiaowei 1; Schneider, Reinhard 1; Popescu, Radian 1; Seeger, Jasmin 2; Grutke, Jonas 2; Zerulla, Benedikt 2; Hetterich, Michael 2,3; Hariskos, Dimitrios; Witte, Wolfram; Powalla, Michael; Gerthsen, Dagmar 1
1 Laboratorium für Elektronenmikroskopie (LEM), Karlsruher Institut für Technologie (KIT)
2 Institut für Angewandte Physik (APH), Karlsruher Institut für Technologie (KIT)
3 Lichttechnisches Institut (LTI), Karlsruher Institut für Technologie (KIT)

Abstract:

Thin-film solar cells with Cu(In,Ga)Se$_{2}$ (CIGS) absorber layers have been intensively studied due to their high power conversion efficiencies. CIGS solar cells with Zn(O,S) buffer layers achieved record efficiencies due to their reduced parasitic absorption compared with the more commonly used CdS buffer. Accordingly, we have studied solution-grown Zn(O,S) buffer layers on polycrystalline CIGS absorber layers by complementary techniques. A bandgap energy Eg of 2.9 eV is detected by means of angle-resolved electroreflectance spectroscopy corresponding to Zn(O,S), whereas an additional Eg of 2.3 eV clearly appeared for a post-annealed CIGS solar cell (250 °C in air) compared with the as-grown state. To identify the chemical phase that contributes to the Eg of 2.3 eV, the microstructure and microchemistry of the Zn(O,S) buffer layers in the as-grown state and after annealing were analyzed by different transmission electron microscopic techniques on the submicrometer scale and energy-dispersive x-ray spectroscopy. We demonstrate that the combination of these methods facilitates a comprehensive analysis of the complex phase constitution of nanoscaled buffer layers. ... mehr


Zugehörige Institution(en) am KIT Institut für Angewandte Physik (APH)
Laboratorium für Elektronenmikroskopie (LEM)
Lichttechnisches Institut (LTI)
Publikationstyp Zeitschriftenaufsatz
Publikationsdatum 28.04.2023
Sprache Englisch
Identifikator ISSN: 0021-8979, 1089-7550, 1520-8850
KITopen-ID: 1000159065
Erschienen in Journal of Applied Physics
Verlag American Institute of Physics (AIP)
Band 133
Heft 16
Seiten Art.-Nr.: 165303
Vorab online veröffentlicht am 26.04.2023
Nachgewiesen in Web of Science
Scopus
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