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Status of the BELLE II Pixel Detector

Belle-II DEPFET and PXD Collaboration; Giakoustidis, Georgios; Abudinen, Fernando; Ackermann, Karlheinz; Ahlburg, Patrick; Albalawi, Mohammed; Alonso, Oscar; Andricek, Laci; Ayad, Rachid; Babu, Varghese; Baur, Anselm; Bernlochner, Florian; Bilka, Tadeas; Bolz, Arthur; Bozek, Andrzej; Camien, Christian; Caldwell, Allen Christopher; Cao, Lu; Chekelian, Vladimir; ... mehr

Abstract:

The Belle II experiment at the super KEK B-factory (SuperKEKB) in Tsukuba, Japan, has been collecting $e^+e^−$ collision data since March 2019. Operating at a record-breaking luminosity of up to $4.7×10^{34} cm^{−2}s^{−1}$, data corresponding to $424 fb^{−1}$ has since been recorded. The Belle II VerteX Detector (VXD) is central to the Belle II detector and its physics program and plays a crucial role in reconstructing precise primary and decay vertices. It consists of the outer 4-layer Silicon Vertex Detector (SVD) using double sided silicon strips and the inner two-layer PiXel Detector (PXD) based on the Depleted P-channel Field Effect Transistor (DePFET) technology. The PXD DePFET structure combines signal generation and amplification within pixels with a minimum pitch of $(50×55) μm^2$. A high gain and a high signal-to-noise ratio allow thinning the pixels to $75 μm$ while retaining a high pixel hit efficiency of about $99%$. As a consequence, also the material budget of the full detector is kept low at $≈0.21%$$\frac{X}{X_0}$ per layer in the acceptance region. This also includes contributions from the control, Analog-to-Digital
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Verlagsausgabe §
DOI: 10.5445/IR/1000159302
Veröffentlicht am 09.06.2023
Originalveröffentlichung
DOI: 10.22323/1.420.0005
Scopus
Zitationen: 1
Dimensions
Zitationen: 1
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Prozessdatenverarbeitung und Elektronik (IPE)
Publikationstyp Proceedingsbeitrag
Publikationsdatum 08.05.2023
Sprache Englisch
Identifikator ISSN: 1824-8039
KITopen-ID: 1000159302
HGF-Programm 54.12.01 (POF IV, LK 01) Detection and Measurement
Erschienen in Proceedings of 10th International Workshop on Semiconductor Pixel Detectors for Particles and Imaging — PoS(Pixel2022), Ed.: G. Carini
Veranstaltung 10th International Workshop on Semiconductor Pixel Detectors for Particles and Imaging (Pixel 2022), Santa Fe, NM, USA, 12.12.2022 – 16.12.2022
Verlag Scuola Internazionale Superiore di Studi Avanzati (SISSA)
Seiten Art.-Nr.: 005
Serie Pos proceedings of science ; 420
Vorab online veröffentlicht am 13.03.2023
Nachgewiesen in Dimensions
Scopus
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