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Graphitizability of polymer thin films: an in situ TEM study of thickness effects on nanocrystalline graphene/glassy carbon formation

Kumar, C. N. Shyam 1; Possel, Clemens 1; Dehm, Simone 1; Chakravadhanula, Venkata Sai Kiran 2; Wang, Di ORCID iD icon 1,3; Wenzel, Wolfgang 1; Krupke, Ralph 1; Kübel, Christian ORCID iD icon 1,3
1 Institut für Nanotechnologie (INT), Karlsruher Institut für Technologie (KIT)
2 Helmholtz-Institut Ulm (HIU), Karlsruher Institut für Technologie (KIT)
3 Karlsruhe Nano Micro Facility (KNMF), Karlsruher Institut für Technologie (KIT)

Abstract (englisch):

Polymer pyrolysis has emerged as a simple and versatile method to synthesize graphenoid (graphene like) materials with varying thickness and properties. The morphology of the thin film, especially the thickness, greatly affects the graphitizability (ability to from ordered graphene/ graphite) and thus the properties of the resulting graphenoid material. Using in situ current annealing inside a transmission electron microscope (TEM), we followed the thickness-dependent structural evolution of the polymer film with a special focus on thickness effects. Up to intermediate temperatures, the structural evolution during current annealing is similar to the evolution during thermal annealing of the thin films. At higher temperatures, thin samples form large graphene layers oriented parallel to the substrate, whereas in thick samples multi-walled cage-like structures are formed. MD simulations reveal a critical film thickness of 40 Å below which, the carbonized layers align parallel to the surface. For thicker samples, the orientation of the layers becomes increasingly misoriented starting from the surface to the center. This structural change can be attributed to the formation of bonded multi-layers from the initially unsaturated activated edges. ... mehr

Zugehörige Institution(en) am KIT Helmholtz-Institut Ulm (HIU)
Institut für Nanotechnologie (INT)
Karlsruhe Nano Micro Facility (KNMF)
Publikationstyp Forschungsdaten
Publikationsdatum 04.07.2023
Erstellungsdatum 01.01.2019 - 31.12.2022
Identifikator DOI: 10.35097/1606
KITopen-ID: 1000159975
HGF-Programm 43.35.03 (POF IV, LK 01) Structural and Functional Behavior of Solid State Systems
Lizenz Creative Commons Namensnennung – Nicht kommerziell 4.0 International
Schlagwörter In-situ TEM

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