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Advanced diagnostic detectors for rogue phenomena, single-shot applications

Caselle, Michele 1; Bielawski, Serge; Chilingaryan, Suren ORCID iD icon 1; Czwalinna, Marie Kristin; Dritschler, Timo ORCID iD icon 1; Kopmann, Andreas ORCID iD icon 2; Kunakovskaya, Ekaterina 1; Manzhura, Olena 1; Funkner, Stefan 3; Niehues, Gudrun 1; Patil, Meghana ORCID iD icon 4; Roussel, Eleonore; Santamaria Garcia, Andrea ORCID iD icon 4; Scomparin, Luca ORCID iD icon 2; Steffen, Bernd; Steinmann, Johannes ORCID iD icon 3; Szwaj, Christophe; Bründermann, Erik ORCID iD icon 3; Müller, Anke-Susanne 1; ... mehr

Abstract (englisch):

The detection of rapid dynamics in diverse physical systems is traditionally very difficult and strongly dominated by several noise contributions. Laser mode-locking, electron bunches in accelerators, and optical-triggered phases in materials are events that carry important information about the system from which they emerge. By detecting single-shot spectra with high repetition rates over long-time scales, new possibilities and applications to diagnose, control and tailor the spectral dynamics of lasers and electron beams in synchrotron and free-electron laser (FEL) accelerators open up. This contribution focuses on the latest developments of real-time, single-shot, high-repetition-rate detectors and data acquisition systems, with a special focus on emerging technologies and new possibilities in the diagnostics of rogue optical signals.


Zugehörige Institution(en) am KIT Institut für Beschleunigerphysik und Technologie (IBPT)
Institut für Hochfrequenztechnik und Elektronik (IHE)
Institut für Prozessdatenverarbeitung und Elektronik (IPE)
Laboratorium für Applikationen der Synchrotronstrahlung (LAS)
Publikationstyp Proceedingsbeitrag
Publikationsdatum 14.03.2023
Sprache Englisch
Identifikator ISBN: 978-1-5106-5917-9
ISSN: 0277-786X
KITopen-ID: 1000160587
HGF-Programm 54.12.03 (POF IV, LK 01) Science Systems
Erschienen in Real-time Measurements, Rogue Phenomena, and Single-Shot Applications VIII
Veranstaltung SPIE LASE (2023), San Francisco, CA, USA, 28.01.2023 – 03.02.2023
Verlag SPIE
Seiten 17
Serie SPIE Proceedings ; 12406
Nachgewiesen in Dimensions
Scopus
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