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Simulations of the compact transverse-deflecting system for ultra-short electron bunch diagnostic

Glukhov, Sergei; Boine-Frankenheim, Oliver; Niedermayer, Uwe; Nabinger, Matthias; Schaefer, Jens; Nasse, Michael 1; Bründermann, Erik ORCID iD icon 1; Mueller, Anke-Susanne ORCID iD icon
1 Institut für Beschleunigerphysik und Technologie (IBPT), Karlsruher Institut für Technologie (KIT)

Abstract:

A compact TDS (transverse-deflecting system) has been proposed for diagnostics of extremely short electron bunches (up to single-digit femtosecond range). The main idea is to use terahertz radiation, produced from optical rectification of the facility’s electron gun laser pulse. This provides an intrinsic synchronization between the electron bunch and the laser pulse. The proposed system is to be constructed at the test facility FLUTE (Ferninfrarot Linac- und Test-Experiment) at Karlsruher Institut für Technologie (KIT), which provides the opportunity to create electron bunches of variable length and at medium energy (7 MeV up to 90 MeV). Simulations in CST MICROWAVE STUDIO are carried out in parallel with the experimental activities to optimize the design of the system. In the present paper the simulation results for several possible designs will be presented.


Verlagsausgabe §
DOI: 10.5445/IR/1000163665
Veröffentlicht am 02.11.2023
Originalveröffentlichung
DOI: 10.18429/JACoW-IPAC2023-THPL192
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Beschleunigerphysik und Technologie (IBPT)
Publikationstyp Proceedingsbeitrag
Publikationsdatum 26.09.2023
Sprache Englisch
Identifikator ISBN: 978-3-95450-231-8
ISSN: 2673-5490
KITopen-ID: 1000163665
HGF-Programm 54.11.11 (POF IV, LK 01) Accelerator Operation, Research and Development
Erschienen in 14th International Particle Accelerator Conference, Venedig, 7th-12th May 2023
Veranstaltung 14th International Particle Accelerator Conference (IPAC 2023), Venedig, Italien, 07.05.2023 – 12.05.2023
Verlag JACoW Publishing
Seiten 4887-4890
Schlagwörter Accelerator Physics, mc6-beam-instrumentation-controls-feedback-and-operational-aspects - MC6: Beam Instrumentation, Controls, Feedback and Operational Aspects, mc6-t03-beam-diagnostics-and-instrumentation - MC6.T03: Beam Diagnostics and Instrumentation
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