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All-inorganic Cs2AgBiBr6 double perovskite single crystals for radiation detectors

Fiederle, Michael 1; Sahsuvar, Simay; Hillebrecht, Harald; Daub, Michael; Schwänzle, Catharine; Cherepy, Nerine J. [Hrsg.]; Fiederle, Michael [Hrsg.] 1; James, Ralph B. [Hrsg.]
1 Institut für Photonenforschung und Synchrotronstrahlung (IPS), Karlsruher Institut für Technologie (KIT)

Abstract (englisch):

Inorganic double perovskite single crystals e.g. Cs2AgBiBr6 have great potential in detecting X- and Gamma-Radiation. These single crystals can be solution processed at low temperature and be possessing of low trap density, high charge carrier mobility, and a tunable bandgap. In this work, Cs2AgBiBr6 single crystals were synthesized using the solution growth method, and we tried to determine the potential of detecting X-Ray radiation by examining especially their electrical and optical properties. Besides that, the values determined by the IV measurement along the dominant {001} lattice plane (1.02x108 – 2.97x109 Ωcm) and the van der Paul measurements made along the trigonal upper surface and pseudo-hexagonal lower surface edges (2.88X109 – 4.39x1010 Ωcm) used for specifically demonstrate the correlation between structure and property. The density of trap states and charge-carrier mobilities, which were calculated from the IV characteristic curve measurements, are 4.44x109 – 6.79x1010 cm–3 and 0.07-24.4 cm2V–1s–1, respectively. Consequently, it has been seen that these crystals obtained by the solution growth method are suitable for use in radiation sensors applications.


Zugehörige Institution(en) am KIT Institut für Photonenforschung und Synchrotronstrahlung (IPS)
Publikationstyp Proceedingsbeitrag
Publikationsdatum 04.10.2023
Sprache Englisch
Identifikator ISBN: 978-1-5106-7119-5
ISSN: 0038-7355; 0361-0748; 0277-786X
KITopen-ID: 1000165219
HGF-Programm 54.12.01 (POF IV, LK 01) Detection and Measurement
Erschienen in Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXV. Ed.: N. Cherepy
Veranstaltung SPIE Optical Engineering + Applications (2023), San Diego, CA, USA, 20.08.2023 – 25.08.2023
Verlag SPIE
Seiten 3
Serie Proceedings / SPIE ; PC12696
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