Fault Sensitivity Analysis of Printed Bespoke Multilayer Perceptron Classifiers

Printed Electronics (PE) is an emerging technology with flexible substrates and ultra-low-cost manufacturing, pro- viding an appealing alternative to traditional wafer-scale silicon fabrication. With the increasing integration of various printed neural network (NN) architectures in diverse applications, the reliability of printed circuits has become a critical concern. This work provides a comprehensive analysis of the fault sensitivity on a variety of classification tasks for various digital and analog realizations of printed multilayer perceptrons (MLPs). We further evaluate different digital architectures, i.e., generic, bespoke, and approximate, to provide a comprehensive fault analysis on different benchmark datasets.