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Thermal Testing and System Reliability: Transferring Thermal Interactions by Heat Conduction through a Peltier-Based Thermal Coupling System

Leitenberger, Felix ORCID iD icon 1; Matthiesen, Sven 1
1 Institut für Produktentwicklung (IPEK), Karlsruher Institut für Technologie (KIT)

Abstract:

Testing and reliability assessment are crucial aspects when considering the thermal domain’s influence on the overall system. Thermal interactions occur between all subsystems, and their separation can disrupt internal thermal interactions, altering temperature profiles. Evaluating
functional system reliability requires accounting for the thermal domain’s impact on temperature-dependent performance and thermal damage limits. However, testing faces challenges due to the lack of a suitable thermal coupling system capable of transferring thermal interactions by heat conduction between spatially separated subsystems. To address this issue, this paper introduces a thermal
coupling system that focuses on the control system and its validation through experimental studies.
Two scenarios were investigated: (I) the original assembly situation with direct heat transfer between
two subsystems, and (II) a spatially separated scenario utilizing the thermal coupling system to estab-
lish heat transfer between the subsystems. The evaluation variables are the temperature curves and
the deviations between the two scenarios. Two different tests with a different amount of heat flows
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Verlagsausgabe §
DOI: 10.5445/IR/1000169503
Veröffentlicht am 05.04.2024
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Produktentwicklung (IPEK)
Publikationstyp Zeitschriftenaufsatz
Publikationsjahr 2024
Sprache Englisch
Identifikator ISSN: 1996-1073
KITopen-ID: 1000169503
Erschienen in Energies
Verlag MDPI
Band 17
Heft 5
Seiten Art.-Nr.: 1127
Vorab online veröffentlicht am 27.02.2024
Nachgewiesen in Scopus
Web of Science
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