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RFSoC Gen3-Based Software-Defined Radio Characterization for the Readout System of Low-Temperature Bolometers

Redondo, M. E. García 1; Muscheid, T. ORCID iD icon 1; Gartmann, R. ORCID iD icon 1; Salum, J. M. 1; Ferreyro, L. P. 1; Müller, N. A. 2; Bonilla-Neira, J. D. 2; Geria, J. M. 2; Bonaparte, J. J. 2; Almela, A.; Ardila-Perez, L. E. ORCID iD icon 1; Hampel, M. R.; Fuster, A. E.; Platino, M.; Sander, O. 1; Weber, M. 1; Etchegoyen, A.
1 Institut für Prozessdatenverarbeitung und Elektronik (IPE), Karlsruher Institut für Technologie (KIT)
2 Institut für Mikro- und Nanoelektronische Systeme (IMS), Karlsruher Institut für Technologie (KIT)

Abstract:

This work reports the performance evaluation of an SDR readout system based on the latest generation (Gen3) of AMD’s Radio-Frequency System-on-Chip (RFSoC) processing platform, which integrates a full-stack processing system and a powerful FPGA with up to 32 high-speed and high-resolution 14-bit Digital-to-Analog Converters and 14-bit Analog-to-Digital Converters. The proposed readout system uses a previously developed multi-band, double-conversion IQ RF-mixing board targeting a multiplexing factor of approximately 1000 bolometers in a bandwidth between 4 and 8 GHz, in line with state-of-the-art microwave SQUID multiplexers. The characterization of the system was performed in two stages, under the conditions typically imposed by the multiplexer and the cold readout circuit: first, in transmission, showing that noise and spurious levels of the generated tones are close to the values imposed by the cold readout, and second, in RF loopback, presenting noise values better than −100 dBc/Hz totally in agreement with the state-of-the-art readout systems. It was demonstrated that the RFSoC Gen3 device is a suitable enabling technology for the next generation of superconducting detector readout systems, reducing system complexity, increasing system integration, and achieving these goals without performance degradation.


Verlagsausgabe §
DOI: 10.5445/IR/1000170157
Veröffentlicht am 22.04.2024
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Mikro- und Nanoelektronische Systeme (IMS)
Institut für Prozessdatenverarbeitung und Elektronik (IPE)
Publikationstyp Zeitschriftenaufsatz
Publikationsmonat/-jahr 04.2024
Sprache Englisch
Identifikator ISSN: 0022-2291, 1573-7357
KITopen-ID: 1000170157
Erschienen in Journal of Low Temperature Physics
Verlag Springer
Vorab online veröffentlicht am 12.04.2024
Nachgewiesen in Dimensions
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