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SafeADArchitect: End-to-End Architecture for Safe and Risk-Aware Automated Driving in Urban Environments

Oboril, Fabian; Schörner, Philip; Sachße, Luka; Nees, Dominik; Percin, Tolgahan; Bürkle, Cornelius; Zeifang, Bernhard; Gremmelmaier, Helen; Ochs, Sven; Gassmann, Bernd; Gottselig, Fabian ORCID iD icon 1; Henkel, Patrick; Schulz, Tobias; Kautzmann, Philipp; Frey, Michael ORCID iD icon 1; Scholl, Kay-Ulrich; Zöllner, Marius; Münsterer, Thomas
1 Institut für Fahrzeugsystemtechnik (FAST), Karlsruher Institut für Technologie (KIT)

Abstract (englisch):

Automated driving is still waiting for its major breakthrough and mainstream adoption. One roadblock for mass deployment in crowded and unstructured environments such as urban traffic is the high degree of uncertainty that significantly reduces the vehicle's usability using today's safety solutions. To tackle this challenge, this paper presents SafeADArchitect, an end-to-end architecture for automated vehicles that ensures usability and safety at the same time. It covers major influencing factors to driving safety from the driving platform, sensor limitations or behavior uncertainties through occlusions, inefficiencies of AI-based perception or planning approaches via adequate safety modules and by mapping possible errors to associated driving risks. Hence, by knowing the overall acceptable risk, reasonable driving decisions can be taken that balance usability and safety.


Zugehörige Institution(en) am KIT Institut für Angewandte Informatik und Formale Beschreibungsverfahren (AIFB)
Institut für Fahrzeugsystemtechnik (FAST)
Publikationstyp Proceedingsbeitrag
Publikationsdatum 24.09.2024
Sprache Englisch
Identifikator ISBN: 979-8-3315-0592-9
ISSN: 2153-0009
KITopen-ID: 1000181712
Erschienen in IEEE 27th International Conference on Intelligent Transportation Systems (ITSC); Edmonton, Kanada, 24.-27.09.2024
Veranstaltung 27th International Conference on Intelligent Transportation Systems (ITSC 2024), Edmonton, Kanada, 24.09.2024 – 27.09.2024
Verlag Institute of Electrical and Electronics Engineers (IEEE)
Seiten S. 2330 – 2337
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