Data from "A ductile chromium-molybdenum alloy resistant to high temperature oxidation"

This dataset contains the relevant data of the submission "A ductile chromium-molybdenum alloy
resistant to high temperature oxidation". All files highlighted by "MC" denote data on Cr-37.2Mo and "MSC" on Cr-36.1Mo-3Si (both alloy compositions given in at.%).

Fig1 = Scanning electron grayscale micrographs using backscattered electron contrast as *.tif images

Fig2a = Area-specific mass changes (average and uncertainty in mg/cm²) as a function of oxidation time (in h); "800C" denotes 800°C and "1100C" denotes 1100°C; the dataset highlighted by "single_sample" is not averaged but determined on a single specimen

Fig2b = Engineering stress-strain curves (in MPa and 1, respectively) for room temperature (= "RT") and 900°C (= "900C")

Fig2c = 1% offset yield strength (in MPa) as a function of testing temperature (in °C)

Fig2d = True work hardening (in MPa) as a function of true stress (in MPa) for room temperature (= "RT") and 900°C (= "900C")

Fig3a and b = Energy-dispersive X-ray spectroscopy maps as fully annotated comma-separated matrix file; the characteristic lines a highlights in the file name "CrK" = Cr-K, "MoL" = Mo-L, "SiK" = Si-K, "OK" = O-K

Fig3c = Atom probe tomography data in the form of Cameca proprietary data file format

Fig4 = Electron backscatter diffraction maps as fully annotated *.ang file

FigE1 = X-ray diffraction patterns of the as cast condition as background-subtracted intensity (in 1) as a function of 2Theta diffraction angle (in °)

FigE3 = Engineering stress-strain curves (in MPa and 1, respectively) for room temperature

FigE4 = X-ray diffraction patterns of the oxidized material (100 h at 800°C = "800C" and 1100°C = "1100C") as background-subtracted intensity (in 1) as a function of 2Theta diffraction angle (in °)

FigE5 = Energy-dispersive X-ray spectroscopy maps as fully annotated comma-separated matrix file; the characteristic lines a highlights in the file name "CrK" = Cr-K, "MoL" = Mo-L, "OK" = O-K

FigE6 = Time-dependent (in h) scale thicknesses determined form scanning electron micrographs of oxide scales (in µm)

FigE7 = Electron backscatter diffraction maps as fully annotated *.ang file