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Bringing Light into the Darkness: Leveraging Hidden Markov Models for Blackbox Fuzzing

Borcherding, Anne ; Giraud, Mark; Häring, Johannes 1
1 Karlsruher Institut für Technologie (KIT)

Abstract:

Securing the network interfaces of industrial control systems is essential for protecting critical infrastructure like water treatment plants and nuclear centrifuges from potential attacks. A key strategy to mitigate risks of successful attacks involves identifying and closing vulnerabilities exploitable through network interfaces using testing techniques such as fuzzing. While established techniques exist for graybox fuzzing, which assume access to system binaries, industrial components often require blackbox testing due to the use of third-party components and regulatory constraints. We propose Palpebratum, an approach that leverages Hidden Markov Models to approximate missing information in blackbox test scenarios. We evaluate Palpebratum’s performance in terms of code coverage, comparing it with two baseline blackbox fuzzers and the graybox fuzzer AFLnwe. Our results demonstrate that Palpebratum significantly outperforms one blackbox fuzzer, achieving an average of 4,379.33 basic blocks compared to 4,307.60 (p-value < 0.001). For the second blackbox fuzzer, Palpebratum achieves comparable coverage but with only half the number of test cases, demonstrating effectiveness despite the Hidden Markov Model’s overhead. ... mehr


Verlagsausgabe §
DOI: 10.5445/IR/1000186202
Veröffentlicht am 30.10.2025
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Informationssicherheit und Verlässlichkeit (KASTEL)
Publikationstyp Proceedingsbeitrag
Publikationsdatum 28.04.2025
Sprache Englisch
Identifikator ISBN: 979-83-315-0180-8
KITopen-ID: 1000186202
Erschienen in 2025 IEEE/ACM International Conference on Automation of Software Test (AST)
Veranstaltung IEEE/ACM International Conference on Automation of Software Test (AST 2025), Ottawa, Kanada, 28.04.2025 – 29.04.2025
Verlag Institute of Electrical and Electronics Engineers (IEEE)
Seiten 148 – 159
Nachgewiesen in Dimensions
Scopus
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