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Toughening beta-Ga₂O₃ via mechanically seeded dislocations

Cheng, Zanlin; Zhang, Jiawen; Gao, Peng 1; Zeng, Guosong ; Fang, Xufei ORCID iD icon 2; Lu, Wenjun
1 Institut für Angewandte Materialien – Angewandte Werkstoffphysik (IAM-AWP), Karlsruher Institut für Technologie (KIT)
2 Institut für Angewandte Materialien – Werkstoff- und Grenzflächenmechanik (IAM-MMI), Karlsruher Institut für Technologie (KIT)

Abstract:

β-Ga$_2$O$_3$ is a promising candidate for next-generation semiconductors, but is limited by its intrinsic brittleness, which hinders its application in flexible electronics and high-precision devices. This study explores a new approach to improving the damage tolerance of (001)-oriented β-Ga$_2$O$_3$ by introducing mechanically seeded dislocations via surface scratching. By applying a Brinell indenter to scratch the surface along the [100] direction, Edge-type dislocations belonging to the (011)[01-1] and/or (0-11)[011] slip systems are effectively generated within a mesoscale wear track. Through a combination of nanoindentation tests, surface morphology analysis, and microstructural characterization using scanning electron microscopy (SEM) and transmission electron microscopy (TEM), it is revealed that the introduction of dislocations significantly mitigates the formation of cleavage cracks during indentation, in contrast to that observed in as-received β-Ga$_2$O$_3$. The mechanically seeded dislocations in the subsurface layers play an important role in preventing brittle fracture by facilitating stable plastic deformation.


Verlagsausgabe §
DOI: 10.5445/IR/1000188473
Veröffentlicht am 29.05.2026
Originalveröffentlichung
DOI: 10.1002/adfm.202522091
Scopus
Zitationen: 1
Dimensions
Zitationen: 2
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Angewandte Materialien – Angewandte Werkstoffphysik (IAM-AWP)
Institut für Angewandte Materialien – Werkstoff- und Grenzflächenmechanik (IAM-MMI)
Publikationstyp Zeitschriftenaufsatz
Publikationsjahr 2026
Sprache Englisch
Identifikator ISSN: 1616-301X, 1057-9257, 1099-0712, 1616-3028
KITopen-ID: 1000188473
HGF-Programm 38.02.01 (POF IV, LK 01) Fundamentals and Materials
Erschienen in Advanced functional materials
Verlag Wiley-VCH Verlag
Vorab online veröffentlicht am 15.12.2025
Schlagwörter β-Ga2O3, crack suppression, dislocations, nanoindentation, TEM characterization
Nachgewiesen in OpenAlex
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Scopus
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