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Toward Variability-Aware Testing

Kästner, Christian; Rhein, Alexander von; Erdweg, Sebastian ORCID iD icon 1; Pusch, Jonas; Apel, Sven; Rendel, Tillmann; Ostermann, Klaus
1 Institut für Programmstrukturen und Datenorganisation (IPD), Karlsruher Institut für Technologie (KIT)

Abstract (englisch):

We investigate how to execute a unit test for all products of a product line without generating each product in isolation in a brute-force fashion. Learning from variability-aware analyses, we (a) design and implement a variability-aware interpreter and, alternatively, (b) reencode variability of the product line to simulate the test cases with a model checker. The interpreter internally reasons about variability, executing paths not affected by variability only once for the whole product line. The model checker achieves similar results by reusing powerful off-the-shelf analyses. We experimented with a prototype implementation for each strategy. We compare both strategies and discuss trade-offs and future directions. In the long run, we aim at finding an efficient testing approach that can be applied to entire product lines with millions of products.


Zugehörige Institution(en) am KIT Institut für Programmstrukturen und Datenorganisation (IPD)
Publikationstyp Proceedingsbeitrag
Publikationsdatum 24.09.2012
Sprache Englisch
Identifikator ISBN: 978-1-4503-1309-4
KITopen-ID: 1000188539
Erschienen in Proccedings of the 4th International Workshop on Feature-Oriented Software Development, FOSD'12; Dresden, Deutschland, 24.-25.09.2012
Veranstaltung 4th ACM International Workshop on Feature-Oriented Software Development (2012), Dresden, Deutschland, 24.09.2012 – 25.09.2012
Verlag Association for Computing Machinery (ACM)
Seiten S. 1–8
Nachgewiesen in Scopus
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