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Impact of substrate curvature on grazing-incidence small-angle X-ray scattering signal: theory and example of Ag thin-film growth

Kamiński, Michał ORCID iD icon 1; Krause, Bärbel ORCID iD icon 1; Abadias, Gregory; Coati, Alessandro; Garreau, Yves; Michel, Anny; Resta, Andrea; Solanki, Karan; Vlad, Alina; Babonneau, David
1 Institut für Photonenforschung und Synchrotronstrahlung (IPS), Karlsruher Institut für Technologie (KIT)

Abstract:

Grazing-incidence small-angle X-ray scattering (GISAXS) is a technique of choice for providing information about the morphology of nano- and micro-structures at surfaces and interfaces, also in real time. The geometry of the sample, in particular its curvature, has an impact on the observed X-ray scattering signal. There are a multitude of systems with sophisticated geometries (including curvature), ranging from electronic devices on flexible substrates to biological membranes, for which GISAXS could provide valuable information. Therefore, in this work the effect of the sample geometry on the GISAXS signal is addressed. More specifically the influence of the substrate curvature and extent along the X-ray beam is considered. The analytical expressions accounting for the effects of those two geometrical parameters are provided, and the way to include them in the analysis of GISAXS patterns is described. The calculations reveal that no corrections are needed for small samples (length over distance to the detector ratio smaller than 1%) and radius of curvature |R| > 50 m. These results allow for a combination of GISAXS with substrate curvature measurements. ... mehr


Verlagsausgabe §
DOI: 10.5445/IR/1000189673
Veröffentlicht am 24.02.2026
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Photonenforschung und Synchrotronstrahlung (IPS)
Publikationstyp Zeitschriftenaufsatz
Publikationsdatum 01.02.2026
Sprache Englisch
Identifikator ISSN: 1600-5767
KITopen-ID: 1000189673
HGF-Programm 56.12.11 (POF IV, LK 01) Materials - Quantum, Complex and Functional
Erschienen in Journal of Applied Crystallography
Verlag International Union of Crystallography
Band 59
Heft Part 1
Seiten 93-107
Schlagwörter grazing-incidence small-angle X-ray scattering; GISAXS; substrate curvature; thin-film growth; stress; real-time technique
Nachgewiesen in Scopus
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