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ARTEMIS - Adaptive Response and Tracking of External Model Inputs in Safety-Critical Systems

Zink, Moritz 1; Baumann, Daniel ORCID iD icon 1; Seidel, Luca 1; Grimm, Daniel ORCID iD icon 1; Sax, Eric 1
1 Institut für Technik der Informationsverarbeitung (ITIV), Karlsruher Institut für Technologie (KIT)

Abstract:

In Cyber-Physical System (CPS), neural networks are increasingly employed to process high-dimensional, heterogeneous sensor data and support real-time, automated decisionmaking. These systems, ranging from autonomous vehicles to smart grids and medical devices, rely heavily on the reliability and accuracy of neural models. However, one of the central challenges in deploying neural networks in real-world CPS is their vulnerability to Out of Distribution (OOD) data-input samples that differ significantly from the training data. OOD data can arise due to unforeseen environmental changes, sensor malfunctions, adversarial conditions, or simply evolving operating contexts. When neural networks encounter such data, their predictions often become unreliable, which can lead to severe consequences, especially in safety-critical applications. This paper presents a structured process for integrating OOD monitoring into CPS model pipelines, addressing the full lifecycle of detection, analysis, and adaptation. A central focus of the paper is the structured handling of detected OOD data. This allows to assess which inputs are most critical to system performance and safety. ... mehr


Originalveröffentlichung
DOI: 10.1109/RASSE64831.2025.11315407
Zugehörige Institution(en) am KIT Institut für Technik der Informationsverarbeitung (ITIV)
Publikationstyp Proceedingsbeitrag
Publikationsdatum 04.11.2025
Sprache Englisch
Identifikator ISBN: 979-8-3315-4435-5
KITopen-ID: 1000190329
Erschienen in 2025 IEEE International Conference on Recent Advances in Systems Science and Engineering (RASSE); Singapur, 04.-07.11.2025
Veranstaltung IEEE International Conference on Recent Advances in Systems Science and Engineering (2025), Singapur, Singapur, 04.11.2025 – 07.11.2025
Verlag Institute of Electrical and Electronics Engineers (IEEE)
Seiten 1–7
Schlagwörter Cyber-Physical Systems, Out of Distribution detection, Lifecycle Model
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