Search for low-mass electron-recoil dark matter using a single-charge sensitive SuperCDMS-HVeV detector
SuperCDMS Collaboration; Albakry, M. F.; Alkhatib, I. ; Alonso-González, D.; Anczarski, J.; Aralis, T.; Aramaki, T.; Ataee Langroudy, I.; Bathurst, C.; Bhattacharyya, R.; Biffl, A. J.; Brink, P. L.; Buchanan, M.; Bunker, R.; Cabrera, B.; Calkins, R.; Cameron, R. A.; Cartaro, C.; Cerdeño, D. G.; ... mehrChang, Y.-Y.; Chaudhuri, M.; Chen, J.-H.; Chen, R.; Chott, N.; Cooley, J.; Coombes, H.; Cushman, P.; Cyna, R.; Das, S.; Dharani, S.; di Vacri, M. L.; Diamond, M. D.; Elwan, M.; Fallows, S.; Fascione, E.; Figueroa-Feliciano, E.; Franzen, S. L.; Gevorgian, A.; Ghaith, M.; Godden, G.; Golatkar, J.; Golwala, S. R.; Gualtieri, R.; Hall, J.; Harms, S. A. S.; Hays, C.; Hines, B. A.; Hong, Z.; Hsu, L.; Huber, M. E.; Iyer, V.; Kashyap, V. K. S.; Keller, S. T. D.; Kelsey, M. H.; Kennard, K. T.; Kromer, Z.; Kubik, A.; Kurinsky, N. A.; Lee, M.; Leyva, J.; Lichtenberg, B.; Liu, J.; Liu, Y.; Lopez Asamar, E.; Lukens, P.; López Noé, R.; MacFarlane, D. B.; Mahapatra, R.; Mammo, J. S.; Mast, N.; Mayer, A. J.; McNamara, P. C.; Meyer zu Theenhausen, H.; Michaud, É.; Michielin, E. 1; Mickelson, K.; Mirabolfathi, N.; Mirzakhani, M.; Mohanty, B.; Mondal, D.; Monteiro, D.; Nelson, J.; Neog, H.; Novati, V.; Orrell, J. L.; Osborne, M. D.; Oser, S. M.; Pandey, L.; Pandey, S.; Partridge, R.; Patel, P. K.; Pedreros, D. S.; Peng, W.; Perry, W. L.; Podviianiuk, R.; Potts, M.; Poudel, S. S.; Pradeep, A.; Pyle, M.; Rau, W.; Ren, R.; Reynolds, T.; Rios, M.; Roberts, A.; Robinson, A. E.; Rosado Del Rio, L.; Ryan, J. L.; Saab, T.; Sadek, D.; Sadoulet, B.; Sahoo, S. P.; Saikia, I.; Salehi, S.; Sander, J.; Sandoval, B.; Sattari, A.; Schmidt, B.; Schnee, R. W.; Serfass, B.; Sharbaugh, A. E.; Shenoy, R. S.; Simchony, A.; Sinervo, P.; Smith, Z. J.; Soni, R.; Stifter, K.; Street, J.; Stukel, M.; Sun, H.; Tanner, E.; Tenpas, N.; Toback, D.; Villano, A. N.; Viol, J.; von Krosigk, B.; Wang, Y.; Wen, O.; Williams, Z.; Wilson, M. J.; Winchell, J.; Yellin, S.; Young, B. A.; Zatschler, B.; Zatschler, S.; Zaytsev, A. 1; Zhang, E.; Zheng, L.; Zuniga, A.; Zurowski, M. J.
1 Institut für Astroteilchenphysik (IAP), Karlsruher Institut für Technologie (KIT)
Abstract:
We present constraints on low-mass dark matter electron scattering and absorption interactions using a SuperCDMS high-voltage eV-resolution (HVeV) detector. Data were taken underground in the NEXUS facility located at Fermilab with an overburden of 225 meters of water equivalent. The experiment benefits from the minimizing of luminescence from the printed circuit boards in the detector holder used in all previous HVeV studies. A blind analysis of 6.1 g·days
of exposure produces exclusion limits for dark matter-electron scattering cross sections for masses as low as 1 MeV/𝑐2, as well as on the photon-dark photon mixing parameter and the coupling constant between axionlike particles and electrons for particles with masses >1.2 eV/𝑐2 probed via absorption processes.
| Zugehörige Institution(en) am KIT |
Institut für Astroteilchenphysik (IAP) |
| Publikationstyp |
Zeitschriftenaufsatz |
| Publikationsdatum |
01.02.2026 |
| Sprache |
Englisch |
| Identifikator |
ISSN: 2470-0010, 2470-0029
KITopen-ID: 1000191152 |
| Erschienen in |
Physical Review D |
| Verlag |
American Physical Society (APS) |
| Band |
113 |
| Heft |
3 |
| Seiten |
Art.-Nr.: 032001 |
| Nachgewiesen in |
Scopus
OpenAlex
Web of Science
|
