Phase plates in the transmission electron microscope: operating principles and applications
Malac, Marek ; Hettler, Simon
1; Hayashida, Misa; Kano, Emi; Egerton, Ray F.; Beleggia, Marco
1 Laboratorium für Elektronenmikroskopie (LEM), Karlsruher Institut für Technologie (KIT)
1; Hayashida, Misa; Kano, Emi; Egerton, Ray F.; Beleggia, Marco1 Laboratorium für Elektronenmikroskopie (LEM), Karlsruher Institut für Technologie (KIT)
Abstract:
In this paper, we review the current state of phase plate imaging in a transmission electron microscope. We focus especially on the hole-free phase plate design, also referred to as the Volta phase plate. We discuss the implementation, operating principles and applications of phase plate imaging. We provide an imaging theory that accounts for inelastic scattering in both the sample and in the hole-free phase plate.
| Zugehörige Institution(en) am KIT | Laboratorium für Elektronenmikroskopie (LEM) |
| Publikationstyp | Zeitschriftenaufsatz |
| Publikationsdatum | 01.02.2021 |
| Sprache | Englisch |
| Identifikator | ISSN: 2050-5698, 2050-5701 KITopen-ID: 1000191196 |
| Erschienen in | Microscopy |
| Verlag | Oxford University Press (OUP) |
| Band | 70 |
| Heft | 1 |
| Seiten | 75–115 |
| Vorab online veröffentlicht am | 15.11.2020 |
| Schlagwörter | hole-free phase plate (HFPP), Volta phase plate (VPP), radiation damage, electron beam-induced sample charging, sample contamination, cryo electron microscopy |
| Nachgewiesen in | Scopus Web of Science OpenAlex |