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Temperature dependence of the long-term annealing behavior of neutron irradiated diodes from 8-inch p-type silicon wafers

Diehl, Leena ; Kałuzińska, Oliwia Agnieszka 1; Mühlnikel, Marie Christin; Andersson, Max; Gerassyova, Natalya; Amer, Jenan; Sicking, Eva; Groner, Dana; Kieseler, Jan 2; Defranchis, Matteo
1 Fakultät für Elektrotechnik und Informationstechnik (ETIT), Karlsruher Institut für Technologie (KIT)
2 Institut für Experimentelle Teilchenphysik (ETP), Karlsruher Institut für Technologie (KIT)

Abstract:

To face the higher levels of radiation due to the 10-fold increase in integrated luminosity during the High-Luminosity LHC, the CMS detector will replace the current Calorimeter Endcap (CE) using the High-Granularity Calorimeter (HGCAL) concept. The high-radiation regions of the CE, where fluences between 1.0 · 1014 neq/cm2 and 1.0 · 1016 neq/cm2 and doses of up to 2 MGy are expected considering an integrated luminosity of 3 ab−1, will be equipped with silicon pad sensors. This includes the entire electromagnetic as well as parts of the hadronic section of the CE. The silicon sensors are processed on 8-inch p-type wafers with an active thickness of 300 μm, 200 μm and 120 μm and cut into hexagonal shapes for optimal use of the full wafer area and tiling. With each main sensor, several small test structures (e.g. pad diodes) are hosted on the wafers, used for quality assurance and radiation hardness tests. In order to investigate the radiation-induced bulk damage, these diodes have been irradiated with reactor neutrons at JSI (Jožef Stefan Institute, Ljubljana, Slovenia) to fluences between 5 · 1014 neq/cm$^2$ and 1.5 · 1016 neq/cm$^2$. ... mehr


Verlagsausgabe §
DOI: 10.5445/IR/1000191850
Veröffentlicht am 02.04.2026
Originalveröffentlichung
DOI: 10.1088/1748-0221/21/03/P03034
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Experimentelle Teilchenphysik (ETP)
Publikationstyp Zeitschriftenaufsatz
Publikationsdatum 01.03.2026
Sprache Englisch
Identifikator ISSN: 1748-0221
KITopen-ID: 1000191850
Erschienen in Journal of Instrumentation
Verlag Institute of Physics Publishing Ltd (IOP Publishing Ltd)
Band 21
Heft 03
Seiten Art.-Nr.: P03034
Nachgewiesen in OpenAlex
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