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Adaptive Radar Clustering and Tracking based on Point Criticality Assessment

Brühl, Tim 1; Vico, Antonio; Goldscheider, Jan; Schwager, Robin 1; Sohn, Tin Stribor; Eberhardt, Tim Dieter; Hohmann, Sören 1
1 Institut für Regelungs- und Steuerungssysteme (IRS), Karlsruher Institut für Technologie (KIT)

Abstract:

Radar sensors are superior at measuring distances and velocities, even in adverse weather conditions. However, the noisiness of radar point clouds requires a filtering cascade to make these sensors usable for applications in automated driving. This filtering may cause hazardous situations if points on existing objects are removed by a filter. To serve as a perception component in fully automated driving systems, radar’s error rate needs to be reduced significantly. To achieve this goal, we advance the view that points should be filtered adaptively according to their presumable relevance for the current driving task. In this work, we present a real-world study of our radar point criticality estimation algorithm. In addition, we introduce methods for acting on critical points. While the Posterior method recalls points in critical regions, we demonstrate how the creation of clusters and tracks can be facilitated for critical radar points. Our methods are evaluated on a novel dataset including 92 critical scenes with pedestrians in a parking garage. We demonstrate that all methods significantly increase detection rates at both the cluster and track levels and enable earlier detection. ... mehr


Originalveröffentlichung
DOI: 10.1109/SMC58881.2025.11343545
Zugehörige Institution(en) am KIT Institut für Regelungs- und Steuerungssysteme (IRS)
Publikationstyp Proceedingsbeitrag
Publikationsdatum 05.10.2025
Sprache Englisch
Identifikator ISBN: 979-8-3315-3358-8
ISSN: 1062-922X
KITopen-ID: 1000191892
Erschienen in 2025 IEEE International Conference on Systems, Man, and Cybernetics (SMC)
Veranstaltung IEEE International Conference on Systems, Man, and Cybernetics (SMC 2025), Wien, Österreich, 05.10.2025 – 08.10.2025
Verlag Institute of Electrical and Electronics Engineers (IEEE)
Seiten 490 - 496
Nachgewiesen in OpenAlex
Scopus
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