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Fault Tree and Markov Chain-Based for Instance-Specific Reliability of Angle Grinders for Circularity

Afifi, Nehal ORCID iD icon 1; Mas, Victor Leon ORCID iD icon 1; Leitenberger, Felix ORCID iD icon 1; Hemmerich, Jonas ORCID iD icon 1; Kleinhans, Lukas ORCID iD icon 1; Grauberger, Patric ORCID iD icon 1; Matthiesen, Sven 1
1 Institut für Produktentwicklung (IPEK), Karlsruher Institut für Technologie (KIT)

Abstract (englisch):

The transition to a Circular Factory (CF) introduces new challenges in reliability analysis, particularly for returned products, where degradation history and failure behavior vary significantly between individual units. Unlike new products, returned angle grinders exhibit heterogeneous failure risks due to different operational histories, wear levels, and maintenance conditions, making their reliability assessment more complex. Traditional reliability models that assume homogeneous degradation rates across products fall short in capturing the unique failure risks posed by returned items. Therefore, instance-specific reliability models are essential to accurately estimate failure probabilities, and reliability metrics, enabling data-driven decision-making for product reprocessing under uncertainty across product generations. This study addresses this challenge by integrating Fault Tree Analysis (FTA) and Markov Chains to model system- and subsystem-level reliability of returned angle grinders within the CF framework.In this study, we first applied the Contact and Channel (C&C2) approach to map embodiment–function relations and visualize interactions between system components and their interfaces. ... mehr


Originalveröffentlichung
DOI: 10.1109/RAMS50514.2026.11424541
Zugehörige Institution(en) am KIT Institut für Produktentwicklung (IPEK)
Publikationstyp Proceedingsbeitrag
Publikationsdatum 26.01.2026
Sprache Englisch
Identifikator ISBN: 979-8-3315-7363-8
ISSN: 0149-144X
KITopen-ID: 1000191923
Erschienen in 2026 Annual Reliability and Maintainability Symposium (RAMS)
Veranstaltung Annual Reliability and Maintainability Symposium (RAMS 2026), Miramar Beach, FL, USA, 26.01.2026 – 29.01.2026
Verlag Institute of Electrical and Electronics Engineers (IEEE)
Seiten 1–7
Serie Conferences
Schlagwörter reliability, Circular Factory, Remanufacturing, Failure Mode
Nachgewiesen in OpenAlex
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