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Optimizing PCBA e-waste management: Intelligent inspection sequencing and recovery strategies using graph neural networks and Reinforcement Learning

Stamer, Florian ORCID iD icon 1; Lanza, Gisela 1; Puttero, Stefano; Galetto, Maurizio
1 Institut für Produktionstechnik (WBK), Karlsruher Institut für Technologie (KIT)

Abstract:

Electronic waste management faces critical challenges due to the complexity and variability of printed circuit board assemblies (PCBAs), which contain both high-value recoverable materials and hazardous components. Current inspection and recovery processes are predominantly manual and static, resulting in inefficiencies and limited scalability. This paper proposes a novel framework that integrates Graph Neural Networks (GNNs) with Reinforcement Learning (RL) to enable adaptive, real-time inspection sequencing and recovery decision-making for PCBAs. By modelling each board as a graph of interconnected components, the GNN encodes structural and defect-related information, providing a dynamic state representation for the RL agent. The agent then chooses a sequence of inspections or recovery strategies, such as reuse, repair or recycle, balancing the cost of diagnostics against the potential value of recovery. A case study on an industrial I/O device demonstrates the approach’s effectiveness with simulations showing that the system learns profitable inspection and recovery policies under uncertainty while reducing unnecessary tests. A comparative analysis of state-of-the-art graph architectures reveals that Graph Attention Networks (GAT) outperform standard Graph Convolutional Networks (GCN). ... mehr


Verlagsausgabe §
DOI: 10.5445/IR/1000191997
Veröffentlicht am 08.04.2026
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Produktionstechnik (WBK)
Publikationstyp Zeitschriftenaufsatz
Publikationsmonat/-jahr 06.2026
Sprache Englisch
Identifikator ISSN: 0278-6125
KITopen-ID: 1000191997
Erschienen in Journal of Manufacturing Systems
Verlag Elsevier
Band 86
Seiten 264–276
Nachgewiesen in Web of Science
OpenAlex
Scopus
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