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TY-RIST: Tactical YOLO Tricks for Real-Time Infrared Small Target Detection

Atrash, Abdulkarim; Ertekin, Seyda; Uğur, Ömür; Moured, Omar ORCID iD icon 1; Chen, Yufan 1; Zhang, Jiaming ORCID iD icon 1
1 Institut für Anthropomatik und Robotik (IAR), Karlsruher Institut für Technologie (KIT)

Abstract:

While critical for defense and surveillance, infrared small target detection (IRSTD) remains a challenging task due to: (1) target loss from minimal features, (2) false alarms in cluttered environments, (3) missed detections from low saliency, and (4) high computational costs. To address these, we propose TY-RIST, an optimized YOLOv12n architecture featuring: (1) a stride-aware backbone with fine-grained receptive fields, (2) a high-resolution detection head, (3) cascaded coordinate attention blocks, and (4) a branch pruning strategy that reduces computational cost up to ~25.5% while marginally enhancing performance and enabling real-time inference. Additionally, we incorporate the Normalized Gaussian Wasserstein Distance (NWD) to improve regression stability. Extensive experiments on four benchmarks and across 20 different models demonstrate state-of-the-art performance, boosting mAP@50 by + 7.9%, Precision by +3%, and Recall by + 10.2%, while running up to ~123 FPS on a single GPU. Cross-dataset validation on a fifth dataset further confirms strong generalization capability. Further results and details are published at www.github.com/moured/TY-RIST.


Originalveröffentlichung
DOI: 10.1109/ICCVW69036.2025.00232
Scopus
Zitationen: 1
Zugehörige Institution(en) am KIT Institut für Anthropomatik und Robotik (IAR)
Publikationstyp Proceedingsbeitrag
Publikationsdatum 19.10.2025
Sprache Englisch
Identifikator ISBN: 979-8-3315-8988-2
KITopen-ID: 1000192404
Erschienen in 2025 IEEE/CVF International Conference on Computer Vision Workshops (ICCVW)
Veranstaltung IEEE/CVF International Conference on Computer Vision Workshops (ICCVW 2025), Honolulu, HI, USA, 19.10.2025 – 20.10.2025
Verlag Institute of Electrical and Electronics Engineers (IEEE)
Seiten 2222 - 2231
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