KIT | KIT-Bibliothek | Impressum | Datenschutz

In Situ Temperature Compensation for Thin-Film Force Sensors

Plogmeyer, Marcel; Tienkaew, Apirak 1; Schott, Anna; Schulze, Volker 1; Bräuer, Günter
1 Institut für Produktionstechnik (WBK), Karlsruher Institut für Technologie (KIT)

Abstract:

Advanced digitalization and automation of production processes as well as the predictive maintenance of machine elements, require reliable sensors to collect in situ data as input for control processes. The quality and reliability of these data are crucial for the successful implementation and acceptance of such solutions. Therefore, sensors that can be integrated and measure as close as possible to the signal origin are of high value. In many applications, force or pressure is a key variable. Precise measurements often need effective temperature compensation, which can be challenging when high and locally concentrated temperature gradients occur (e.g., in cutting tools of machining operations). Therefore, a new thin-film sensor design is presented with a diamond-like carbon (DLC)-based temperature sensor placed directly beneath a manganin-based force sensor to enable in situ temperature compensation of the force sensor. The setup and manufacturing of the thin-film system on steel washers are presented. Temperature compensation is successfully demonstrated in an industrial environment by integrating the sensory washer beneath a cutting insert. ... mehr


Originalveröffentlichung
DOI: 10.1109/SENSORS59705.2025.11331243
Zugehörige Institution(en) am KIT Institut für Produktionstechnik (WBK)
Publikationstyp Proceedingsbeitrag
Publikationsdatum 19.10.2025
Sprache Englisch
Identifikator ISBN: 979-8-3315-4467-6
ISSN: 1930-0395
KITopen-ID: 1000192418
Erschienen in 2025 IEEE SENSORS
Veranstaltung IEEE SENSORS (2025), Vancouver, Kanada, 19.10.2025 – 22.10.2025
Verlag Institute of Electrical and Electronics Engineers (IEEE)
Seiten 1–4
Externe Relationen Siehe auch
Schlagwörter force sensor, thin-film, manganin, DLC, temperature compensation, in situ measurement, process control
Nachgewiesen in Scopus
OpenAlex
KIT – Die Universität in der Helmholtz-Gemeinschaft
KITopen Landing Page