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Change-Aware Test Suite Prioritization for CPS using Multi-Domain Dependency Graphs

Beck, Maximilian ORCID iD icon 1; Boll, Jonas; Luntzel, Vitus ORCID iD icon 1; Sax, Eric 1
1 Institut für Technik der Informationsverarbeitung (ITIV), Karlsruher Institut für Technologie (KIT)

Abstract (englisch):

Cyber-Physical Systems integrate mechanical, electrical, and software components, resulting in tightly coupled development processes and extensive regression-testing demands. As agile and over-the-air update strategies increase the number of system versions, executing full regression test suites becomes infeasible due to resource and time constraints. Existing test case prioritization techniques, developed largely within the software domain, do not account for cross-domain dependencies and therefore overlook faults that arise only through interactions between heterogeneous engineering artifacts. This work presents a change-aware, cross-domain test case prioritization method that builds on Multi-Domain Dependency Graphs (MDDGs) as a unified representation of CPS. By propagating modifications via graph-based relations across all engineering domains, change impact is estimated and used to derive execution orders that reflect the system’s structural and semantic dependencies. The approach is instantiated via a set of graph-based metrics that score test cases along paths connecting changed artifacts and test-relevant elements. A modular implementation with interfaces to existing engineering tools enables integration into modelbased development environments without requiring changes to underlying domain-specific models. ... mehr


Originalveröffentlichung
DOI: 10.1109/SysCon66367.2026.11503556
Zugehörige Institution(en) am KIT Institut für Technik der Informationsverarbeitung (ITIV)
Publikationstyp Proceedingsbeitrag
Publikationsdatum 06.04.2026
Sprache Englisch
Identifikator ISBN: 979-8-3315-9151-9
KITopen-ID: 1000193215
Erschienen in 2026 IEEE International Systems Conference (SysCon)
Veranstaltung 20th IEEE International Systems Conference (SysCon 2026), Halifax, Kanada, 06.04.2026 – 09.04.2026
Verlag Institute of Electrical and Electronics Engineers (IEEE)
Seiten 1–7
Projektinformation SFB 1608/1, 501798263 (DFG, DFG KOORD, SFB 1608)
Nachgewiesen in OpenAlex
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