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An ontology-driven bayesian network approach to fault diagnosis and correction in manufacturing

Wilhelm, Yannick ; Reimann, Peter 1; Gauchel, Wolfgang; Mitschang, Bernhard
1 Institut für Programmstrukturen und Datenorganisation (IPD), Karlsruher Institut für Technologie (KIT)

Abstract:

Efficient Fault Diagnosis and Correction (FDC) is crucial for maintaining high availability in manufacturing systems. This paper presents a novel ontology-driven approach for creating Bayesian Networks (BNs) to support decision-making in FDC. An ontology is developed to represent fault knowledge from domain-specific data sources, including Failure Mode, Effects, and Criticality Analysis (FMECA) data. This ontology is used as a template for creating the BN structure. The probability parameters of the BN are identified heuristically via FMECA criticality information, deterministic relationships, and expert knowledge. A case-based evaluation using an assembly line for solenoid valves demonstrates the BN’s accurate FDC prediction performance.


Verlagsausgabe §
DOI: 10.5445/IR/1000193220
Veröffentlicht am 13.05.2026
Originalveröffentlichung
DOI: 10.1007/s00170-025-17136-9
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Programmstrukturen und Datenorganisation (IPD)
Publikationstyp Zeitschriftenaufsatz
Publikationsmonat/-jahr 03.2026
Sprache Englisch
Identifikator ISSN: 0268-3768, 1433-3015
KITopen-ID: 1000193220
Erschienen in The International Journal of Advanced Manufacturing Technology
Verlag Springer
Band 143
Heft 5-6
Seiten 2521–2544
Vorab online veröffentlicht am 23.02.2026
Schlagwörter Decision support system, Fault diagnosis and correction, Ontology, Bayesian network, FMECA
Nachgewiesen in Scopus
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