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Self-supervised learning for multi-label sewer defect classification

Yildizli, Tugba ; Jia, Tianlong 1; Langeveld, Jeroen; Taormina, Riccardo
1 Institut für Wasser und Umwelt (IWU), Karlsruher Institut für Technologie (KIT)

Abstract:

Automated sewer defect detection has advanced through deep learning, particularly supervised methods using CCTV images, but based on large annotated datasets. This paper proposes a semi-supervised learning (SSL) approach to reduce labeling demands. The method comprises self-supervised pre-training on unlabeled images using SwAV (Swapping Assignments between multiple Views) followed by fine-tuning for multi-label classification. Experiments on the Sewer-ML dataset demonstrate that the SSL approach, trained on only 35k labeled images, achieves an F1-score of 69.11%, and F2$_{CIW}$ of 54.22%, surpassing the fully supervised baseline trained from scratch on 1.04 million images. Increasing the unlabeled pre-training data further enhances performance, while ImageNet initialization consistently outperforms training from scratch. Self-supervised learning also helps mitigate the effects of mislabeled data, which is observed to be present even in the Sewer-ML ground truth. Overall, self-supervised learning provides an accurate, scalable, and cost-effective alternative to fully supervised approaches, particularly in data-scarce or imperfectly labeled scenarios.


Verlagsausgabe §
DOI: 10.5445/IR/1000193333
Veröffentlicht am 18.05.2026
Originalveröffentlichung
DOI: 10.1016/j.autcon.2025.106751
Scopus
Zitationen: 1
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Wasser und Umwelt (IWU)
Publikationstyp Zeitschriftenaufsatz
Publikationsmonat/-jahr 02.2026
Sprache Englisch
Identifikator ISSN: 0926-5805
KITopen-ID: 1000193333
Erschienen in Automation in Construction
Verlag Elsevier
Band 182
Seiten Art.Nr: 106751
Vorab online veröffentlicht am 02.01.2026
Schlagwörter Semi-supervised learning; Computer vision; Sewer defect classification; Asset management; Transfer learning
Nachgewiesen in Scopus
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