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Gaussian Noise-Augmented Machine Learning for Reliable Friction Estimation in Bolted Joints

Afifi, Nehal ORCID iD icon 1; Boujnah, Ines 1; Matthiesen, Sven 1
1 Institut für Produktentwicklung (IPEK), Karlsruher Institut für Technologie (KIT)

Abstract:

Summary & ConclusionsAccurate prediction of the functional behavior of bolted joints is essential for ensuring reliability in mechanical systems. Traditional analytical, numerical and empirical methods often fall short in capturing nonlinear and multivariate interactions among key parameters such as preload force, torque, and friction coefficients, especially under variable operating conditions. Adding to this existing models frequently rely on limited data, which fail to represent the diverse conditions. To address these limitations, this study proposes a machine learning-based reliability framework that leverages synthetic data generation and advanced modeling techniques to enable scalable, low-cost prediction of critical performance parameters. A rule-based data generation pipeline was developed using deterministic equations from established standards and augmented with 2D Gaussian noise modeled from experimental deviations to simulate real-world variability. The synthetic datasets enable efficient training of predictive models without requiring large volumes of experimental data. Three modeling approaches were evaluated: gradient boosting (XGBoost), multilayer perceptrons (MLPs), and one-dimensional convolutional neural networks (1D-CNNs). ... mehr


Originalveröffentlichung
DOI: 10.1109/RAMS50514.2026.11424454
Zugehörige Institution(en) am KIT Institut für Produktentwicklung (IPEK)
Publikationstyp Proceedingsbeitrag
Publikationsdatum 26.01.2026
Sprache Englisch
Identifikator ISBN: 979-8-3315-7362-1
ISSN: 0149-144X
KITopen-ID: 1000194765
Erschienen in 2026 Annual Reliability and Maintainability Symposium (RAMS)
Veranstaltung Annual Reliability and Maintainability Symposium (RAMS 2026), Miramar Beach, FL, USA, 26.01.2026 – 29.01.2026
Verlag Institute of Electrical and Electronics Engineers (IEEE)
Seiten 1–7
Externe Relationen Siehe auch
Schlagwörter Reliability, XGBoost, CNN, MLP, Data Augmentation
Nachgewiesen in OpenAlex
Scopus
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