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Evaluation and improvement of the thermal performance of power modules using the Finite-Element-Method (FEM) and Multi-Material Additive Manufacturing (MMAM)

Lehmann, Chantal-Liv 1; Utsch, Daniel; Sprenger, Mario; Thielen, Nils; Franke, Jörg; Risch, Florian; Schulze, Volker 1; Zanger, Frederik ORCID iD icon 1
1 Institut für Produktionstechnik (WBK), Karlsruher Institut für Technologie (KIT)

Abstract (englisch):

Mechatronic Integrated Devices (MID) for high temperature and harsh environments include power electronic applications. There is a growing need for innovative packaging concepts that enhance thermal performance, and reliability while offering greater manufacturing efficiency. This work proposes a novel approach that combines the evaluation of thermal and thermo-mechanical performance of various innovative designs using numerical simulations with the design freedom of the additive manufacturing technology Vat Photopolymerization (VPP), including an advanced multi-material process with ceramic and metallic slurries. It can be found that the thermal performance is reduced by 16% using aluminum nitride as ceramic material and innovative comprised module designs, which can be demonstrated by thermal simulations and printed by VPP in one single machine.


Originalveröffentlichung
DOI: 10.1109/MIDCongress66428.2025.11547395
Zugehörige Institution(en) am KIT Institut für Produktionstechnik (WBK)
Publikationstyp Proceedingsbeitrag
Publikationsdatum 02.07.2025
Sprache Englisch
Identifikator ISBN: 979-8-3315-6672-2
KITopen-ID: 1000195226
Erschienen in 2025 16th International MID Congress Mechatronic Integration Discourse (MID Congress)
Veranstaltung 16th Mechatronic Integration Discourse (2025), Amberg, Deutschland, 02.07.2025 – 03.07.2025
Verlag Institute of Electrical and Electronics Engineers (IEEE)
Seiten 1-6
Projektinformation MultiPower (BMWE, 22835 N/1)
Schlagwörter Multi-Material Additive Manufacturing, Metalceramic composites, Vat Photopolymerization, Thermal Performance, Finite-Element-Method Analysis
Nachgewiesen in Scopus
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