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L-SCALE: Locality-Sensitive Coverage for Automata LEarning

Giraud, Mark Leon 1; Engel, Bastian 1; Nasarek, Lea 1; Storrer, Yannis 1; Takacs, Philipp 1; Wittemund, Leon Philipp 1
1 Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (IOSB)

Abstract:

Approaches like AFLNet have successfully managed to improve upon stateless fuzzers by incorporating state information in the form of response codes or enum values in the source code. Most approaches use the state information directly instead of attempting to infer a state machine. However, having an explicit state model of the System under Test (SUT) is beneficial for designing more sophisticated fuzzing techniques, demonstrated by approaches that infer a state machine by using the responses the SUT sends. In this work, we propose L-SCALE, an approach based on the 𝐿∗-Algorithm utilizing the coverage of individual messages as a measure of the behavior of the SUT. In contrast to other approaches that utilize only the responses of the SUT, this allows us insights into the internal state of the SUT, which is often not reflected in the responses it sends. Since coverage is a very fine-grained measure, we utilize TLSH, a Locality Sensitive Hash (LSH), in combination with a threshold value for the similarity of the hashes to categorize slightly different coverage measurements as the same observation. We also contribute mogi, an emulator framework that provides deterministic execution and incremental snapshotting capabilities. ... mehr


Verlagsausgabe §
DOI: 10.5445/IR/1000195438
Veröffentlicht am 20.07.2026
Cover der Publikation
Zugehörige Institution(en) am KIT Fakultät für Informatik – Lehrstuhl IES Beyerer: Interaktive Echtzeitsysteme (Lehrstuhl IES Beyerer: Interaktive Echtzeitsysteme)
Publikationstyp Proceedingsbeitrag
Publikationsdatum 13.04.2026
Sprache Englisch
Identifikator ISBN: 979-8-4007-2476-3
KITopen-ID: 1000195438
HGF-Programm 46.23.04 (POF IV, LK 01) Engineering Security for Production Systems
Weitere HGF-Programme 46.23.01 (POF IV, LK 01) Methods for Engineering Secure Systems
Erschienen in Proceedings of the 7th ACM/IEEE International Conference on Automation of Software Test
Veranstaltung 7th ACM/IEEE International Conference on Automation of Software Test (AST 2026), Rio de Janeiro, Brasilien, 12.04.2026 – 18.04.2026
Verlag Association for Computing Machinery (ACM)
Seiten 55–65
Nachgewiesen in Scopus
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