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Scalable Registration-Based Encryption from Lattices

Klooß, Michael ORCID iD icon 1; Lai, Russell W. F.; Siemer, Jan Niklas; Swarnakar, Monisha
1 Institut für Informationssicherheit und Verlässlichkeit (KASTEL), Karlsruher Institut für Technologie (KIT)

Abstract:

Registration-Based Encryption (RBE) is a public-key encryption mechanism which allows a user to register their identity (e.g. email address) and self-generated public key with a key curator (e.g. an organisation). The key curator aggregates these keys into a compact digest. Using only this digest and the recipient's identity, anyone can encrypt messages to any registered user. As the key curator is not entrusted with any secrets, RBE presents a solution to the key escrow problem, which impedes the adoption of Identity-Based Encryption. This makes RBE an attractive solution for secure communication with and among members of an organisation while preserving user privacy. Despite recent advances [Döttling-Kolonelos-Lai-Lin-Malavolta-Rahimi, EUROCRYPT'23; Fiore-Kolonelos-dePerthuis, ASIACRYPT'23], practical constructions of RBE are still limited to a small number of registered users (e.g. 1024), lack post-quantum security, or have ciphertext sizes scaling in the order of GB. The predominant way towards constructing practical RBE is a generic transformation from Laconic Encryption (LE). In this work, we identify an efficiency bottleneck in this transformation and present a new primitive called Batched Laconic Encryption (BLE) which admits a more succinct transformation to RBE. ... mehr


Originalveröffentlichung
DOI: 10.1109/SP63933.2026.00199
Zugehörige Institution(en) am KIT Institut für Informationssicherheit und Verlässlichkeit (KASTEL)
Publikationstyp Proceedingsbeitrag
Publikationsdatum 18.05.2026
Sprache Englisch
Identifikator ISBN: 979-8-3315-6065-2
ISSN: 1081-6011
KITopen-ID: 1000195635
Erschienen in 2026 IEEE Symposium on Security and Privacy (SP)
Veranstaltung IEEE Symposium on Security and Privacy (SP 2026), San Francisco, CA, USA, 18.05.2026 – 21.05.2026
Verlag Institute of Electrical and Electronics Engineers (IEEE)
Seiten 2520 - 2538
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