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Machine learning for metrology in manufacturing

Lanza, Gisela, (1) 1; Schmitt, Robert, (1); Dewulf, Wim, (1); Hansen, Hans, (1); Zhang, Yang, (2); Montavon, Benjamin; Stamer, Florian ORCID iD icon
1 Institut für Produktionstechnik (WBK), Karlsruher Institut für Technologie (KIT)

Abstract:

Machine learning is transforming manufacturing metrology by enabling data-driven modeling, automation, and real-time decision-making across the measurement process. This keynote reviews recent advances and future directions for integrating machine learning (ML) throughout the measurement workflow—from system setup to decision-making—by structuring the analysis of the state of the art using a data flow framework. Key applications include ML-assisted setup and calibration, enhanced measurement, virtual measurements, and classification-based inspection. The remaining key challenge is the integration of metrological traceability, standardized uncertainty quantification, explainability, and reproducibility. Bridging the underlying conceptual gap in understanding and evaluating uncertainty is essential to establish scientifically rigorous and industrially reliable ML-driven metrology for future manufacturing systems.


Verlagsausgabe §
DOI: 10.5445/IR/1000195961
Veröffentlicht am 04.08.2026
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Produktionstechnik (WBK)
Publikationstyp Zeitschriftenaufsatz
Publikationsjahr 2026
Sprache Englisch
Identifikator ISSN: 0007-8506
KITopen-ID: 1000195961
Erschienen in CIRP Annals
Verlag Elsevier
Band 75
Heft 2
Seiten 971–997
Vorab online veröffentlicht am 21.07.2026
Nachgewiesen in Scopus
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Web of Science
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