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Reusing d-DNNFs for Efficient Feature-Model Counting – Summary

Sundermann, Chico; Raab, Heiko; Heß, Tobias; Thüm, Thomas; Schaefer, Ina ORCID iD icon 1
1 Institut für Informationssicherheit und Verlässlichkeit (KASTEL), Karlsruher Institut für Technologie (KIT)

Abstract:

The underlying work Reusing d-DNNFs for Efficient Feature-Model Counting was originally published in the TOSEM journal [Su24] in November, 2024. Software product lines are commonly used to manage families of related products that share different features. Products are composed by combining those features. However, not every combination or configuration of features leads to a desired product as there are dependencies between those features. Feature models are widely used to define the set of valid configurations by describing features and constraints between them. As feature models in practice often contain thousands of features and constraints, numerous automated analyses have been proposed. Many of these analyses rely on computing the number of valid configurations, which is very computationally demanding. Moreover, most applications rely on many counting operations, potentially thousands or even millions in practice. In this work, we propose to reuse d-DNNFs to accelerate repetitive counting queries on feature models. To this end, we realize algorithms that traverse d-DNNFs to perform counting and propose various optimizations. Our large-scale empirical evaluation shows that our approach can reduce runtimes for single analysis by multiple orders of magnitudes (e. ... mehr


Zugehörige Institution(en) am KIT Institut für Informationssicherheit und Verlässlichkeit (KASTEL)
Publikationstyp Proceedingsbeitrag
Publikationsjahr 2026
Sprache Englisch
Identifikator ISSN: 1617-5468
KITopen-ID: 1000196022
Erschienen in 2026 Software Engineering, SE 2026
Veranstaltung Software Engineering (SE 2026), Bern, Schweiz, 23.02.2026 – 27.02.2026
Verlag Gesellschaft für Informatik (GI)
Seiten 85 - 86
Serie P-377
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