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Trust, but Verify: Reliable Compute-in-Memory via Double-Reference Sensing and Selective Recompute

Nezhadi, Ali ORCID iD icon 1; Chatzopoulos, Odysseas; Gizopoulos, Dimitris; Tahoori, Mehdi 1
1 Institut für Technische Informatik (ITEC), Karlsruher Institut für Technologie (KIT)

Abstract:

Compute-in-Memory (CiM) architectures based on non-volatile memories (NVMs) promise substantial performance and energy benefits by mitigating the memory wall through near-memory, massively parallel computation. However, NVM-CiM designs suffer from intrinsic reliability challenges caused by process variations, analog sensing of resistive states, imperfect reference levels, and reduced sense margins as operand count increases. These effects lead to overlapping output distributions and decision failures at the sense amplifier level, which accumulate across large applications and undermine end-to-end correctness. In this work, we propose a software–hardware co-design approach to ensure application-level reliability in NVM-CiM systems. Our method employs double-reference sensing to flag potential decision failures during CiM execution and records potential errors using a lightweight error-flag mechanism. Flagged outputs are selectively recomputed on the CPU, correcting errors while preserving the benefits of CiM execution. We quantify decision failure probabilities for different sense amplifier designs, study optimal reference placement, and quantify application-level reliability, comparing CiM execution with a CPU-only baseline. ... mehr


Originalveröffentlichung
DOI: 10.1109/IOLTS69666.2026.11633847
Zugehörige Institution(en) am KIT Institut für Technische Informatik (ITEC)
Publikationstyp Proceedingsbeitrag
Publikationsmonat/-jahr 07.2026
Sprache Englisch
Identifikator ISBN: 979-8-3315-4685-4
KITopen-ID: 1000196610
Erschienen in 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS)
Veranstaltung 32nd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2026), Polignano a Mare, Italien, 01.07.2026 – 03.07.2026
Verlag Institute of Electrical and Electronics Engineers (IEEE)
Seiten 1–8
Externe Relationen Siehe auch
Schlagwörter Compute-in-Memory(CiM), reliability, energy efficiency, analog compute, non-volatile memories
Nachgewiesen in Scopus
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