KIT | KIT-Bibliothek | Impressum | Datenschutz

SHOUT-Trainer: Closed-loop Trainer for Silent Data Corruption Hunting and Observation Using Transformers

Ghasemi, S. Maryam; Mangadahalli Siddaramu, Shanmukha 1; Tahoori, Mehdi B. 1
1 Institut für Technische Informatik (ITEC), Karlsruher Institut für Technologie (KIT)

Abstract:

Silent data corruptions (SDCs) pose a significant reliability challenge in modern computing systems as they silently propagate incorrect results without triggering architectural exceptions or system failures. Fault injection (FI) is the de facto approach for quantifying SDC behavior, but large-scale fault injection campaigns are computationally prohibitive and difficult to apply continuously during software development. In this work, we propose a learning-based framework that predicts the probability of SDC propagation directly from source code using large language models trained on FI-annotated programs. To improve prediction accuracy, we introduce a closed-loop training strategy in which weakly predicted SDC program sites are identified and used to guide targeted FI campaigns on the corresponding programs. The resulting FI data is incorporated into the training dataset, creating a closed-loop retraining cycle. Experimental evaluation shows that the closed-loop predictor reduces the mean absolute error by 43.3% on the poorly predicted SDC program sites of the open-loop model, confirming that targeted feedback improves prediction accuracy in the most challenging regions of the program space.


Originalveröffentlichung
DOI: 10.1109/IOLTS69666.2026.11633678
Zugehörige Institution(en) am KIT Institut für Technische Informatik (ITEC)
Publikationstyp Proceedingsbeitrag
Publikationsmonat/-jahr 07.2026
Sprache Englisch
Identifikator ISBN: 979-8-3315-4685-4
KITopen-ID: 1000196622
Erschienen in 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS)
Veranstaltung 32nd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2026), Polignano a Mare, Italien, 01.07.2026 – 03.07.2026
Verlag Institute of Electrical and Electronics Engineers (IEEE)
Seiten 1–5
Schlagwörter Silent Data Corruption, Silent Data Error, Hardware Fault Model, Large Language Model, Transformer
Nachgewiesen in OpenAlex
Scopus
KIT – Die Universität in der Helmholtz-Gemeinschaft
KITopen Landing Page