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Bayesian Optimization for Design Parameters of 3D Image Data Analysis

Exler, David ORCID iD icon 1; Gómez, Joaquin Eduardo Urrutia ORCID iD icon 1; Krüger, Martin ORCID iD icon 1; Schliephake, Maike ORCID iD icon; Jbeily, John; Vitacolonna, Mario; Rudolf, Rüdiger; Reischl, Markus ORCID iD icon 1
1 Institut für Automation und angewandte Informatik (IAI), Karlsruher Institut für Technologie (KIT)

Abstract:

Deep learning-based segmentation and classification are crucial to large-scale biomedical imaging, particularly for 3D data, where manual analysis is impractical. Although many methods exist, selecting suitable models and tuning parameters remains a major bottleneck in practice. Hence, we introduce the 3D data Analysis Optimization Pipeline, a method designed to facilitate the design and parameterization of segmentation and classification using two Bayesian Optimization stages. First, the pipeline selects a segmentation model and optimizes postprocessing parameters using a domain-adapted syntactic benchmark dataset. To ensure a concise evaluation of segmentation performance, we introduce a segmentation quality metric that serves as the objective function. Second, the pipeline optimizes design choices of a classifier, such as encoder and classifier head architectures, incorporation of prior knowledge, and pretraining strategies. To reduce manual annotation effort, this stage includes an assisted class-annotation workflow that extracts predicted instances from the segmentation results and sequentially presents them to the operator, eliminating the need for manual tracking. ... mehr


Volltext §
DOI: 10.5445/IR/1000197507
Veröffentlicht am 30.09.2026
Originalveröffentlichung
DOI: 10.48550/arXiv.2602.15660
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Automation und angewandte Informatik (IAI)
Publikationstyp Forschungsbericht/Preprint
Publikationsdatum 17.02.2026
Sprache Englisch
Identifikator KITopen-ID: 1000197507
Verlag arxiv
Serie Computer Science - Computer Vision and Pattern Recognition
Schlagwörter Computer Vision and Pattern Recognition (cs.CV), Artificial Intelligence (cs.AI)
Nachgewiesen in arXiv
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