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Ontology-Based Scenario Generation for Competency-Driven Operator Training

Schicketanz, Leonie ORCID iD icon 1; Hoernicke, Mario; Zoitl, Alois; Barth, Mike ORCID iD icon 1
1 Institut für Regelungs- und Steuerungssysteme (IRS), Karlsruher Institut für Technologie (KIT)

Abstract (englisch):

Simulation-based training helps control room operators maintain decision-making and intervention abilities in highly automated process plants. Operator training simulators provide a virtual representation of plant processes and control systems to execute training scenarios, including abnormal operating conditions. Effective training requires diverse scenarios aligned with operator experience and defined learning objectives. In practice, creating scenarios for a specific plant is labor-intensive and requires specialized expertise, especially after plant or control system changes. This motivates automating scenario generation based on plant operating procedures, possible fault conditions (e.g., pump failure during start-up), the operator's training history, and didactic concepts such as learning objectives and competencies. We present a model-based assistance system that integrates control logic, fault conditions, the operator's training history, and formalized didactic concepts in a knowledge graph based on an ontology. The approach includes competency-oriented prioritization based on a simplified skill-decay heuristic to identify training needs and guide scenario generation. ... mehr


Originalveröffentlichung
DOI: 10.1109/CASE69030.2026.11704286
Zugehörige Institution(en) am KIT Institut für Regelungs- und Steuerungssysteme (IRS)
Publikationstyp Proceedingsbeitrag
Publikationsmonat/-jahr 08.2026
Sprache Englisch
Identifikator ISBN: 979-8-3195-4158-1
KITopen-ID: 1000197748
Erschienen in 2026 IEEE 22nd International Conference on Automation Science and Engineering (CASE)
Veranstaltung 22nd IEEE International Conference on Automation Science and Engineering (CASE 2026), Shenyang, China, 17.08.2026 – 21.08.2026
Verlag Institute of Electrical and Electronics Engineers (IEEE)
Seiten 1767–1774
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