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Fluence-Dependent Multimodal Response of NdGaO₃(110) Single Crystals to 147 MeV Kr Ions

Karipbayev, Zhakyp T.; Tokasheva, Miramgul S.; Bakytkyzy, Aizat; Zhunusbekov, Amangeldy M.; Zhurkin, Ernar B.; Konuhova, Marina; Scherer, Theo A. 1; Bezrukovs, Vladislavs; Popov, Anatoli I.
1 Institut für Angewandte Materialien – Angewandte Werkstoffphysik (IAM-AWP), Karlsruher Institut für Technologie (KIT)

Abstract:

This exploratory study compares one pristine NdGaO3(110) crystal with one crystal irradiated at 1 × 1011 ions cm−2 and one crystal irradiated at 1 × 1012 ions cm−2 using 147 MeV 84Kr ions. Because each condition is represented by a single independent specimen, specimen-to-specimen variability is confounded with the irradiation condition, and no specimen-level statistical inference is made. Symmetric X-ray diffraction, condition-averaged confocal micro-Raman spectroscopy, and UV–Vis–NIR transmission were used to compare surface-normal lattice response, local vibrational line shapes, and radiation-induced optical attenuation. The nearly angle-independent XRD shift at 1 × 1011 ions cm−2 is dominated by a common angular offset, whereas the two surviving harmonics at 1 × 1012 ions cm−2 give a model-conditioned estimate ε110 = +0.509 ± 0.040%. At the higher fluence, the integrated intensities captured in the coupled θ–2θ condition decrease to 9.35 ± 0.46% for (110) and 1.29 ± 0.06% for (220), while the (220) FWHM ratio reaches 7.83 ± 0.73. These fit-derived errors do not include specimen alignment or between-specimen variability. The archived condition-averaged Raman spectra retain Pbnm-like vibrational groups, while the fitted FWHM values of the 168, 214/215, and 449–470 cm−1 features increase by 15.7%, 19.4%, and 14.8%. ... mehr


Verlagsausgabe §
DOI: 10.5445/IR/1000198490
Veröffentlicht am 27.10.2026
Originalveröffentlichung
DOI: 10.3390/app162010130
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Angewandte Materialien – Angewandte Werkstoffphysik (IAM-AWP)
Publikationstyp Zeitschriftenaufsatz
Publikationsjahr 2026
Sprache Englisch
Identifikator ISSN: 2076-3417
KITopen-ID: 1000198490
HGF-Programm 31.13.06 (POF IV, LK 01) Plant Engineering
Erschienen in Applied Sciences
Verlag MDPI
Band 16
Heft 20
Seiten 10130
Vorab online veröffentlicht am 13.10.2026
Schlagwörter NdGaO3; swift heavy ions; krypton irradiation; X-ray diffraction; Raman spectroscopy; differential attenuation; lattice strain; GaO6 octahedra
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