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Sulfur incorporation in high level nuclear waste glass: a S K-edge XAFS investigation

Brendebach, B. 1; Denecke, M. A. 1; Roth, G. 1; Weisenburger, S. 1
1 Karlsruher Institut für Technologie (KIT)


We perform X-ray absorption fine structure (XAFS) spectroscopy measurements at the sulfur K-edge to elucidate the electronic and geometric bonding of sulfur atoms in borosilicate glass used for the vitrification of high level radioactive liquid waste. The sulfur is incorporated as sulfate, most probably as sodium sulfate, which can be deduced from the X-ray absorption near edge structure (XANES) by fingerprint comparison with reference compounds. This finding is backed up by Raman spectroscopy investigation. In the extended XAFS data, no second shell beyond the first oxygen layer is visible. We argue that this is due to the sulfate being present as small clusters located into voids of the borosilicate network. Hence, destructive interference of the variable surrounding prohibits the presence of higher shell signals. The knowledge of the sulfur bonding characteristics is essential for further optimization of the glass composition and to balance the requirements of the process and glass quality parameters, viscosity and electrical resistivity on one side, waste loading and sulfur uptake on the other side.

Verlagsausgabe §
DOI: 10.5445/IR/120081730
Veröffentlicht am 17.04.2018
DOI: 10.1088/1742-6596/190/1/012186
Zitationen: 19
Zitationen: 21
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Nukleare Entsorgung (INE)
Publikationstyp Zeitschriftenaufsatz
Publikationsjahr 2009
Sprache Englisch
Identifikator ISSN: 1742-6588, 1742-6596
KITopen-ID: 120081730
HGF-Programm 32.25.02 (POF II, LK 01) Anwendung der Technologie
Erschienen in Journal of physics / Conference Series
Verlag Institute of Physics Publishing Ltd (IOP Publishing Ltd)
Band 190
Seiten 012186/1-6
Erscheinungsvermerk 14th Internat.Conf.on X-Ray Absorption Fine Structure (XAFS 14), Camerino, I, July 26-31, 2009
Nachgewiesen in Scopus
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