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DOI: 10.5445/IR/120099310
Veröffentlicht am 23.04.2018
DOI: 10.1088/1742-6596/463/1/012038
Zitationen: 5

Multi-contrast computed laminography at ANKA light source

Cheng, Y.; Altapova, V.; Helfen, L.; Xu, F.; Dos Santos Rolo, T.; Vagovi, P.; Fiederle, M.; Baumbach, T.

X-ray computed laminography has been developed as a non-destructive imaging technique for inspecting laterally extended objects. Benefiting from a parallel-beam geometry, high photon flux of synchrotron sources and modern high-resolution detector systems, synchrotron radiation computed laminography (SRCL) results in a powerful three-dimensional microscopy technique. SRCL can be combined with different contrast modes, such as absorption, phase and dark-field contrasts, in order to provide complementary information for the same specimen. Here we show the development of SRCL at the TopoTomo beamline of the ANKA light source. A novel instrumentation design is reported and compared to the existing one. For this design, experimental results from different contrast modalities are shown.

Zugehörige Institution(en) am KIT Karlsruhe Nano Micro Facility (KNMF)
ANKA - die Synchrotronstrahlungsquelle am KIT (ANKA)
Publikationstyp Zeitschriftenaufsatz
Jahr 2013
Sprache Englisch
Identifikator ISSN: 1742-6588, 1742-6596
URN: urn:nbn:de:swb:90-AAA1200993105
KITopen ID: 120099310
HGF-Programm 55.51.10; LK 02
Erschienen in Journal of physics / Conference Series
Band 463
Seiten 012038/1-5
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