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Multi-contrast computed laminography at ANKA light source

Cheng, Y.; Altapova, V.; Helfen, L.; Xu, F.; Dos Santos Rolo, T.; Vagovi, P.; Fiederle, M.; Baumbach, T.

Abstract:
X-ray computed laminography has been developed as a non-destructive imaging technique for inspecting laterally extended objects. Benefiting from a parallel-beam geometry, high photon flux of synchrotron sources and modern high-resolution detector systems, synchrotron radiation computed laminography (SRCL) results in a powerful three-dimensional microscopy technique. SRCL can be combined with different contrast modes, such as absorption, phase and dark-field contrasts, in order to provide complementary information for the same specimen. Here we show the development of SRCL at the TopoTomo beamline of the ANKA light source. A novel instrumentation design is reported and compared to the existing one. For this design, experimental results from different contrast modalities are shown.

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Verlagsausgabe §
DOI: 10.5445/IR/120099310
Veröffentlicht am 23.04.2018
Originalveröffentlichung
DOI: 10.1088/1742-6596/463/1/012038
Scopus
Zitationen: 8
Zugehörige Institution(en) am KIT ANKA - die Synchrotronstrahlungsquelle am KIT (ANKA)
Karlsruhe Nano Micro Facility (KNMF)
Publikationstyp Zeitschriftenaufsatz
Jahr 2013
Sprache Englisch
Identifikator ISSN: 1742-6588, 1742-6596
urn:nbn:de:swb:90-AAA1200993105
KITopen-ID: 120099310
HGF-Programm 55.51.10 (POF II, LK 02)
Erschienen in Journal of physics / Conference Series
Band 463
Seiten 012038/1-5
Nachgewiesen in Scopus
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