Optical method for improving the accuracy of intrinsic normal zone temperature measurements on thin film superconductors during recovery under load
Hellmann, S.; Noe, M.
| Zugehörige Institution(en) am KIT | Institut für Technische Physik (ITEP) |
| Publikationstyp | Poster |
| Publikationsjahr | 2015 |
| Sprache | Englisch |
| Identifikator | KITopen-ID: 220102364 |
| HGF-Programm | 37.06.02 (POF III, LK 01) New Power Network Technology |
| Erscheinungsvermerk | 24th International Conference on Magnet Technology (MT 2015), Seoul, Korea, October 18-23, 2015 |