Global and local grain analysis during in-situ straining by TEM automated crystal orientation and phase mapping (ACOM) (EBSD-like TEM)
Kobler, A.; Hahn, H.; Kübel, C.
| Zugehörige Institution(en) am KIT | Institut für Nanotechnologie (INT) |
| Publikationstyp | Vortrag |
| Publikationsjahr | 2012 |
| Sprache | Englisch |
| Identifikator | KITopen-ID: 230086635 |
| HGF-Programm | 43.16.01 (POF II, LK 02) KNMF laboratory for micro a.nanostruct. |
| Erscheinungsvermerk | 15th European Microscopy Congress (EMC 2012), Manchester, GB, September 16-21, 2012 |