The influence of secondary fluorescence from elements adjacent to the microbeam spot on local concentration determination with PIXE
| Zugehörige Institution(en) am KIT | Institut für Angewandte Kernphysik (IAK) |
| Publikationstyp | Vortrag |
| Publikationsjahr | 1981 |
| Sprache | Englisch |
| Identifikator | KITopen-ID: 240015732 |
| Erscheinungsvermerk | Proc.of the 2nd Internat.Conf.on Particle Induced X-Ray Emission and its Analytical Applications, Lund, S, June 9-12, 1980 Nuclear Instruments and Methods, 181(1981) |