Discrete shape analysis of the energy distribution to discriminate non-atomic signal contributions in depth profiling with SNMS
| Zugehörige Institution(en) am KIT | Institut für Instrumentelle Analytik (IFIA) |
| Publikationstyp | Vortrag |
| Publikationsjahr | 1999 |
| Sprache | Englisch |
| Identifikator | KITopen-ID: 240044452 |
| HGF-Programm | 22.03.03 (Vor POF, LK 01) |
| Erscheinungsvermerk | Asian and Pacific Surface and Interface Analysis Conf. (APSIA), Singapore, SGP, November 30 - December 4, 1998 Surface and Interface Analysis, 28(1999) |